24008 Datasheet, PDF (2/2 Pages) Aries Electronics, Inc. – High-Frequency Center Probe Test Socket for Devices up to 13mm Square

High-Frequency Center Probe Test Socket
for Devices up to 13mm Square
• TEST PCB DIAMETER SPRING PROBE PAD PLATING: 30µ [0.75µ] min. Au per MIL-G-45204 over 30µ [0.75µ] min. Ni per SEA
AMS-QQ-N-290. Pad must be the same height as top surface of PCB. Please refer to the Custom Socket Drawing supplied by
Aries after receipt of your order for your specific application.
FULL-ARRAY SHOWN AS AN EXAMPLE; YOUR SPECIFIC DEVICE
PATTERN/FOOTPRINT WILL BE SUPPLIED WHEN ORDERED.
ALL DIMENSIONS: INCHES [MILLI-
METERS]
ALL TOLERANCES: ±0.005 [0.13]
UNLESS OTHERWISE SPECIFIED
CUSTOMIZATION: In addition to the
standard products shown on this
page, Aries specializes in custom
design and production. Special mate-
rials, platings, sizes, and configura-
tions can be furnished, depending on
the quantity. NOTE: Aries reserves
the right to change product general
specifications without notice.
SPRING PROBES
Bristol, PA 19007-6810 USA
TEL [phone] • FAX [phone]
WWW.ARIESELEC.COM • [e-mail]
PRINTOUTS OF THIS DOCUMENT MAY BE OUT OF DATE AND SHOULD BE CONSIDERED UNCONTROLLED
24008
2 of 2
Rev. 1.5