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AO3702 Datasheet, PDF (2/5 Pages) Alpha & Omega Semiconductors – N-Channel Enhancement Mode Field Effect Transistor
AO3702
Electrical Characteristics (TJ=25°C unless otherwise noted)
Symbol
Parameter
Conditions
Min Typ Max Units
STATIC PARAMETERS
BVDSS Drain-Source Breakdown Voltage
IDSS
Zero Gate Voltage Drain Current
ID=250µA, VGS=0V
VDS=20V, VGS=0V
IGSS
VGS(th)
ID(ON)
Gate-Body leakage current
Gate Threshold Voltage
On state drain current
VDS=0V, VGS=±8V
VDS=VGS ID=250µA
VGS=4.5V, VDS=5V
VGS=4.5V, ID=3.5A
RDS(ON)
gFS
VSD
IS
Static Drain-Source On-Resistance
VGS=2.5V, ID=3A
VGS=1.8V, ID=2.5A
Forward Transconductance
VDS=5V, ID=2A
Diode Forward Voltage
IS=1A,VGS=0V
Maximum Body-Diode Continuous Current
20
TJ=55°C
0.5
25
TJ=125°C
V
1
µA
5
±100 nA
0.68 1
V
A
50
62
mΩ
70
90
56
70 mΩ
66
85
15
S
0.7
1
V
1.6
A
DYNAMIC PARAMETERS
Ciss
Input Capacitance
Coss
Output Capacitance
Crss
Reverse Transfer Capacitance
Rg
Gate resistance
VGS=0V, VDS=10V, f=1MHz
VGS=0V, VDS=0V, f=1MHz
260 320 pF
48
pF
27
pF
3
4.5
Ω
SWITCHING PARAMETERS
Qg
Total Gate Charge
2.9 3.8 nC
Qgs
Gate Source Charge
VGS=4.5V, VDS=10V, ID=3.5A
0.4
nC
Qgd
Gate Drain Charge
0.6
nC
tD(on)
Turn-On DelayTime
2.5
ns
tr
tD(off)
Turn-On Rise Time
Turn-Off DelayTime
VGS=4.5V, VDS=10V, RL=3Ω,
RGEN=6Ω
3.2
ns
21
ns
tf
Turn-Off Fall Time
3
ns
trr
Body Diode Reverse Recovery Time IF=3.5A, dI/dt=100A/µs
14
19
ns
Qrr
Body Diode Reverse Recovery Charge IF=3.5A, dI/dt=100A/µs
3.4
nC
SCHOTTKY PARAMETERS
VF
Forward Voltage Drop
IF=0.5A
0.37 0.5
V
Irm
Maximum reverse leakage current
VR=16V
VR=16V, TJ=125°C
0.1
mA
20
CT
Junction Capacitance
VR=10V
52
pF
trr
Schottky Reverse Recovery Time
IF=1A, dI/dt=100A/µs
Qrr
Schottky Reverse Recovery Charge IF=1A, dI/dt=100A/µs
9.2
12
ns
1.7
nC
A: The value of R θJA is measured with the device mounted on 1in 2 FR-4 board with 2oz. Copper, in a still air environment with T A =25°C. The
value in any given application depends on the user's specific board design. The current rating is based on the t ≤ 10s thermal resistance
rating.
B: Repetitive rating, pulse width limited by junction temperature.
C. The R θJA is the sum of the thermal impedence from junction to lead R θJL and lead to ambient.
D. The static characteristics in Figures 1 to 6 are obtained using <300 µs pulses, duty cycle 0.5% max.
E. These tests are performed with the device mounted on 1 in 2 FR-4 board with 2oz. Copper, in a still air environment with T A=25°C. The
SOA curve provides a single pulse rating.
Rev1:March 2008
THIS PRODUCT HAS BEEN DESIGNED AND QUALIFIED FOR THE CONSUMER MARKET. APPLICATIONS OR USES AS CRITICAL
COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS ARE NOT AUTHORIZED. AOS DOES NOT ASSUME ANY LIABILITY ARISING
OUT OF SUCH APPLICATIONS OR USES OF ITS PRODUCTS. AOS RESERVES THE RIGHT TO IMPROVE PRODUCT DESIGN,
FUNCTIONS AND RELIABILITY WITHOUT NOTICE.
Alpha Omega Semiconductor, Ltd.
www.aosmd.com