APM3011N Datasheet, PDF (10/11 Pages) Anpec Electronics Coropration – N-Channel Enhancement Mode MOSFET

APM3011N
Reliability test program
Test item
SOLDERABILITY
HOLT
PCT
TST
Method
MIL-STD-883D-2003
MIL-STD 883D-1005.7
JESD-22-B, A102
MIL-STD 883D-1011.9
Description
245°C,5 SEC
1000 Hrs Bias @ 125°C
168 Hrs, 100% RH, 121°C
-65°C ~ 150°C, 200 Cycles
Carrier Tape & Reel Dimension
E
Po
P
D
P1
F
W
t
Bo
Ao
D1
Ko
T2
J
C
A
B
T1
Application
TO-252
Application
A
330±3
F
B
100 ± 2
D
C
13 ± 0. 5
D1
J
2 ± 0.5
Po
T1
16.4 +0.3
-0.2
P1
T2
2.5± 0.5
Ao
W
16 + 0.3
16 - 0.1
Bo
P
8 ± 0.1
Ko
E
1.75± 0.1
t
TO-252 7.5 ± 0.1
Application
A
TO-263 380±3
Application
F
1.5± 0.1
B
80 ± 2
D
1.5+ 0.25 4.0 ± 0.1
C
J
13 ± 0. 5 2 ± 0.5
D1
Po
2.0 ± 0.1
T1
24 ± 4
P1
6.8 ± 0.1
T2
2± 0.3
Ao
10.4± 0.1
W
24 + 0.3
- 0.1
Bo
2.5± 0.1
P
16 ± 0.1
Ko
0.3±0.05
E
1.75± 0.1
t
TO-263 11.5 ± 0.1 1.5 +0.1 1.5± 0.25 4.0 ± 0.1 2.0 ± 0.1 10.8 ± 0.1 16.1± 0.1 5.2± 0.1 0.35±0.013
(mm)
Copyright  ANPEC Electronics Corp.
10
Rev. A.3 - Mar., 2002
www.anpec.com.tw