APM2522NU Datasheet, PDF (10/11 Pages) Anpec Electronics Coropration – N-Channel Enhancement Mode MOSFET

APM2522NU
Reliability test program
Test item
SOLDERABILITY
HOLT
PCT
TST
Method
MIL-STD-883D-2003
MIL-STD 883D-1005.7
JESD-22-B, A102
MIL-STD 883D-1011.9
Description
245°C,5 SEC
1000 Hrs Bias @125°C
168 Hrs, 100% RH, 121°C
-65°C ~ 150°C, 200 Cycles
Carrier Tape & Reel Dimensions
E
F
W
Po
P
D
P1
t
Bo
Ao
D1
J
C
A
Ko
T2
B
T1
Application A
TO-252
330±3
F
7.5±0.1
B
100±2
D
1.5±0.1
C
J
T1
T2
W
P
E
13±0.5
2±0.5
16.4+0.3
-0.2
2.5±0.5
16+0.3
16-0.1
8±0.1 1.75±0.1
D1
Po
P1
Ao
Bo
Ko
t
1.5±0.25 4.0±0.1 2.0±0.1 6.8±0.1 10.4±0.1 2.5±0.1 0.3±0.05
(mm)
Copyright © ANPEC Electronics Corp.
10
Rev. A.1 - Jun., 2006
www.anpec.com.tw