AME8800_08 Datasheet, PDF (27/36 Pages) Analog Microelectronics – 300mA CMOS LDO

AME
AME8800 / 8811
300mA CMOS LDO
n Characterization Curve(For reference only)
Stability vs. ESR vs. I_Load
10000
Unstable Region
1000
100
C_L=2µF
10
Stable Region
1
0.1
0.01
0
Untested Region
50
100
150
200
ILOAD (mA)
10000
1000
100
Stability vs. ESR vs. I_Load
Unstable Region
C_L=10µF
10
Stable Region
1
0.1
0.01
0.001
0
Untested Region
50
100
150
200
ILOAD (mA)
Dropout Voltage vs. Temp.
220
210
200
190
V_out=3V
180
170
160
150
-45
Rev.T.05
-5
25
55
85
Temperature (^oC)
10000
1000
Stability vs. ESR vs. I_Load
Unstable Region
100
C_L=3µF
10
Stable Region
1
0.1
Untested Region
0.01
0
50
100
150
200
ILOAD (mA)
Quiescent Current vs. Temp.
35
34
33
32
31
30
29
28
27
-45
-5
25
55
85
Temperature (^oC)
Load Regulation vs. Temp.
0.58
0.56
0.54
0.52
0.50
0.48
0.46
0.44
0.42
0.40
-45
-5
25
55
Temperature (^oC)
85
27