AM29LV800B_05 Datasheet, PDF (31/49 Pages) Advanced Micro Devices – 8 Megabit (1 M x 8-Bit/512 K x 16-Bit) CMOS 3.0 Volt-only Boot Sector Flash Memory

TEST CONDITIONS
3.3
Device
Under
Test
2.7 kΩ
C_L
6.2 kΩ
Note: Diodes are IN3064 or equivalent
Figure 11. Test Setup
Table 3. Test Specifications
Test Condition
-90,
-70
-120 Unit
Output Load
1 TTL gate
Output Load Capacitance, C_L
(including jig capacitance)
30
100
pF
Input Rise and Fall Times
5
ns
Input Pulse Levels
0.0–3.0
V
Input timing measurement
reference levels
1.5
V
Output timing measurement
reference levels
1.5
V
KEY TO SWITCHING WAVEFORMS
WAVEFORM
INPUTS
Steady
OUTPUTS
Changing from H to L
Changing from L to H
Don’t Care, Any Change Permitted
Changing, State Unknown
Does Not Apply
Center Line is High Impedance State (High Z)
3.0 V
0.0 V
Input
1.5 V
Measurement Level
Figure 12. Input Waveforms and
Measurement Levels
1.5 V
Output
Am29LV800B
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