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AM29LV800B_05 Datasheet, PDF (29/49 Pages) Advanced Micro Devices – 8 Megabit (1 M x 8-Bit/512 K x 16-Bit) CMOS 3.0 Volt-only Boot Sector Flash Memory
DC CHARACTERISTICS
CMOS Compatible
Parameter
Description
Test Conditions
Min
Typ
Max
ILI
Input Load Current
ILIT
A9 Input Load Current
ILO
Output Leakage Current
ICC1
VCC Active Read Current
(Notes 1, 2)
VIN = VSS to VCC,
VCC = VCC max
VCC = VCC max; A9 = 12.5 V
VOUT = VSS to VCC,
VCC = VCC max
CE# = VIL, OE# = VIH,
Byte Mode
5 MHz
1 MHz
CE# = VIL, OE# = VIH,
Word Mode
5 MHz
1 MHz
±1.0
35
±1.0
7
12
2
4
7
12
2
4
ICC2
VCC Active Write Current
(Notes 2, 3, 5)
CE# = VIL, OE# = VIH
15
30
ICC3
ICC4
ICC5
VIL
VIH
VID
VCC Standby Current (Note 2)
VCC Reset Current (Note 2)
Automatic Sleep Mode
(Notes 2, 4)
Input Low Voltage
Input High Voltage
Voltage for Autoselect and
Temporary Sector Unprotect
CE#, RESET# = VCC±0.3 V
RESET# = VSS ± 0.3 V
VIH = VCC ± 0.3 V;
VIL = VSS ± 0.3 V
VCC = 3.3 V
0.2
5
0.2
5
0.2
5
–0.5
0.7 x VCC
11.5
0.8
VCC + 0.3
12.5
VOL
VOH1
VOH2
VLKO
Output Low Voltage
IOL = 4.0 mA, VCC = VCC min
Output High Voltage
IOH = –2.0 mA, VCC = VCC min
IOH = –100 µA, VCC = VCC min
Low VCC Lock-Out Voltage (Note
4)
0.85 VCC
VCC–0.4
2.3
0.45
2.5
Notes:
1. The ICC current listed is typically less than 2 mA/MHz, with OE# at VIH. Typical VCC is 3.0 V.
2. Maximum ICC specifications are tested with VCC = VCCmax.
3. ICC active while Embedded Erase or Embedded Program is in progress.
4. Automatic sleep mode enables the low power mode when addresses remain stable for tACC + 30 ns.
5. Not 100% tested.
Unit
µA
µA
µA
mA
mA
µA
µA
µA
V
V
V
V
V
V
Am29LV800B
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