AM29DL400B Datasheet, PDF (27/42 Pages) Advanced Micro Devices – 4 Megabit (512 K x 8-Bit/256 K x 16-Bit) CMOS 3.0 Volt-only, Simultaneous Operation Flash Memory

PRELIMINARY
TEST CONDITIONS
3.3 V
Device
Under
Test
C_L
6.2 kΩ
2.7 kΩ
Note: Diodes are IN3064 or equivalent
Figure 11. Test Setup
21606C-15
Table 7. Test Specifications
Test Condition
All
-70, -80 others Unit
Output Load
1 TTL gate
Output Load Capacitance, C_L
(including jig capacitance)
30
100
pF
Input Rise and Fall Times
5
ns
Input Pulse Levels
0.0–3.0
V
Input timing measurement
reference levels
1.5
V
Output timing measurement
reference levels
1.5
V
KEY TO SWITCHING WAVEFORMS
WAVEFORM
INPUTS
Steady
OUTPUTS
Changing from H to L
Changing from L to H
Don’t Care, Any Change Permitted
Changing, State Unknown
Does Not Apply
Center Line is High Impedance State (High Z)
KS000010-PAL
3.0 V
0.0 V
Input
1.5 V
Measurement Level
1.5 V
Figure 12. Input Waveforms and Measurement Levels
Output
21606C-16
Am29DL400B
27