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AM29LV800B Datasheet, PDF (24/42 Pages) Advanced Micro Devices – 8 Megabit (1 M x 8-Bit/512 K x 16-Bit) CMOS 3.0 Volt-only Boot Sector Flash Memory
PRELIMINARY
DC CHARACTERISTICS
CMOS Compatible
Parameter
Description
Test Conditions
Min
Typ
ILI
Input Load Current
VIN = VSS to VCC,
VCC = VCC max
ILIT
A9 Input Load Current
VCC = VCC max; A9 = 12.5 V
ILO
Output Leakage Current
VOUT = VSS to VCC,
VCC = VCC max
CE# = VIL, OE# = VIH,
5 MHz
7
ICC1
VCC Active Read Current
(Note 1)
Byte Mode
CE# = VIL, OE# = VIH,
1 MHz
5 MHz
2
7
Word Mode
1 MHz
2
ICC2
VCC Active Write Current
(Notes 2 and 4)
CE# = VIL, OE# = VIH
15
ICC3
VCC Standby Current
VCC = VCC max;
CE#, RESET# = VCC±0.3 V
ICC4
VCC Reset Current
VCC = VCC max;
RESET# = VSS ± 0.3 V
ICC5
Automatic Sleep Mode (Note 3)
VIH = VCC ± 0.3 V;
VIL = VSS ± 0.3 V
VIL
Input Low Voltage
VIH
Input High Voltage
VID
Voltage for Autoselect and
Temporary Sector Unprotect
VCC = 3.3 V
0.2
0.2
0.2
–0.5
0.7 x VCC
11.5
VOL
VOH1
VOH2
VLKO
Output Low Voltage
Output High Voltage
Low VCC Lock-Out Voltage
(Note 4)
IOL = 4.0 mA, VCC = VCC min
IOH = –2.0 mA, VCC = VCC min
IOH = –100 µA, VCC = VCC min
0.85 VCC
VCC–0.4
2.3
Notes:
1. The ICC current listed is typically less than 2 mA/MHz, with OE# at VIH. Typical VCC is 3.0 V.
2. ICC active while Embedded Erase or Embedded Program is in progress.
3. Automatic sleep mode enables the low power mode when addresses remain stable for tACC + 30 ns.
4. Not 100% tested.
Max
Unit
±1.0
µA
35
µA
±1.0
µA
12
4
mA
12
4
30
mA
5
µA
5
µA
5
µA
0.8
V
VCC + 0.3 V
12.5
V
0.45
V
V
2.5
V
24
Am29LV800B