UT54ACS164E Datasheet, PDF (2/9 Pages) Aeroflex Circuit Technology – 8-Bit Shift Registers

LOGIC DIAGRAM
(9)
CLR
(8)
CLK
SERIAL
A ⁽¹⁾
B ⁽²⁾
C
C
C
C
C
C
C
C
R
R
R
R
R
R
R
R
K
K
K
K
K
K
K
K
S
S
S
S
S
S
S
S
(3)
Q_A
OPERATIONAL ENVIRONMENT¹
PARAMETER
Total Dose
SEU Threshold ²
SEL Threshold
Neutron Fluence
(4)
Q_B
(5)
Q_C
(6)
Q_D
(10)
Q_E
LIMIT
1.0E6
80
120
1.0E14
(11)
Q_F
(12)
Q_G
(13)
Q_H
UNITS
rads(Si)
MeV-cm²/mg
MeV-cm²/mg
n/cm²
Notes:
1. Logic will not latchup during radiation exposure within the limits defined in the table.
2. Device storage elements are immune to SEU affects.
ABSOLUTE MAXIMUM RATINGS
SYMBOL
PARAMETER
LIMIT
UNITS
V_DD
Supply voltage
-0.3 to 7.0
V
V_I/O
T_STG
T_J
T_LS
Θ_JC
I_I
Voltage any pin
Storage Temperature range
Maximum junction temperature
Lead temperature (soldering 5 seconds)
Thermal resistance junction to case
DC input current
-.3 to V_DD + .3
-65 to +150
+175
+300
20
±10
V
°C
°C
°C
°C/W
mA
P_D
Maximum power dissipation
1
W
Note:
1. Stresses outside the listed absolute maximum ratings may cause permanent damage to the device. This is a stress rating only, functional operation of the device at
these or any other conditions beyond limits indicated in the operational sections is not recommended. Exposure to absolute maximum rating conditions for extended
periods may affect device reliability.
RECOMMENDED OPERATING CONDITIONS
SYMBOL
V_DD
V_IN
T_C
PARAMETER
Supply voltage
Input voltage any pin
Temperature range
LIMIT
3.0 to 5.5
0 to V_DD
-55 to + 125
UNITS
V
V
°C
2