OP467_15 Datasheet, PDF (5/20 Pages) Analog Devices – Quad Precision, High Speed Operational Amplifier

OP467
WAFER TEST LIMITS¹
@ VS = ±15.0 V, TA = 25°C, unless otherwise noted.
Table 3.
Parameter
Offset Voltage
Input Bias Current
Input Offset Current
Input Voltage Range²
Common-Mode Rejection Ratio
Power Supply Rejection Ratio
Large Signal Voltage Gain
Output Voltage Range
Supply Current
Symbol
VOS
IB
IOS
CMRR
PSRR
AVO
VO
ISY
Conditions
VCM = 0 V
VCM = 0 V
VCM = ±12 V
V = ±4.5 V to ±18 V
RL = 2 kΩ
RL = 2 kΩ
VO = 0 V, RL = ∞
Limit
±0.5
600
100
±12
80
96
83
±13.0
10
Unit
mV max
nA max
nA max
V min/max
dB min
dB min
dB min
V min
mA max
1 _{Electrical tests and wafer probe to the limits shown. Due to variations in assembly methods and normal yield loss, yield after packaging is not guaranteed for standard}
product dice. Consult sales to negotiate specifications based on dice lot qualifications through sample lot assembly and testing.
2 _{Guaranteed by CMR test.}
Rev. * | Page 5 of 20