|
CN-0232 Datasheet, PDF (1/6 Pages) Analog Devices – Minimizing Spurious Outputs Using a Synthesizer with an Integrated VCO and an External PLL Circuit | |||
|
Circuit Note
CN-0232
Circuits from the Lab⢠reference circuits are engineered and
tested for quick and easy system integration to help solve todayâs
analog, mixed-signal, and RF design challenges. For more
information and/or support, visit www.analog.com/CN0232.
Devices Connected/Referenced
ADF4350
Fractional-N PLL Synthesizer with
Integrated VCO
ADF4153 Fractional-N PLL Frequency Synthesizer
Minimizing Spurious Outputs Using a Synthesizer with an Integrated VCO and
an External PLL Circuit
EVALUATION AND DESIGN SUPPORT
Circuit Evaluation Boards
ADF4350 Evaluation Board (EVAL-ADF4350EB2Z)
ADF4153 Evaluation Board (EVAL-ADF4153EBZ1)
Design and Integration Files
Schematics, Layout Files, Bill of Materials
3.3V VVCO
3.3V VDD
CIRCUIT FUNCTION AND BENEFITS
The circuit shown in Figure 1 uses the ADF4350 synthesizer with
an integrated VCO and an external PLL to minimize spurious
outputs by isolating the PLL synthesizer circuitry from the VCO
circuit.
LOCK
DETECT
VVCO
REFERENCE
TCXO
26MHz
16 17
1nF 1nF
VVCO
29 REFIN
51â¦
1 CLK
2 DATA
3 LE
28 10 4 26 6 32
30
25
MUXOUT LD
RFOUTB+ 14
RFOUTBâ 15
PHASE
FREQUENCY
DETECTOR
CHARGE
PUMP
VCO
VVCO
4.7kâ¦
22 RSET
COUNTERS
RFOUTAâ 13
RFOUTA+ 12
ADF4350
VTUNE 20
CPOUT 7
CPGND SDGND AGND
8
31
9
AGNDVCO
11 18 21
SW 5
DGND TEMP VCOM VREF
27
19
23 24
51⦠51â¦
1nF
1nF
51⦠51â¦
1nF
1nF
VCO
TUNING
VOLTAGE
RFOUTA+
51â¦
RFOUTB+
51â¦
10pF
3.3V VDD
0.1µF 10pF
0.1µF 10pF
0.1µF
1nF 1nF
7
AVDD
15
DVDD
16
10
14
VP
SDVDD MUXOUT
8 REFIN
11 CLK
12 DATA
13 LE
PHASE
FREQUENCY
DETECTOR
CHARGE
PUMP
CP 2
LOOP FILTER
360â¦
100nF
22nF
4.7nF
4.7kâ¦
1 RSET
CPGND
COUNTERS
ADF4153
AGND DGND
RFINA 6
RFINB 5
200â¦
100pF
100pF
3
4
9
RF IN
51â¦
51â¦
Figure 1. ADF4153 PLL Connected to ADF4350 (Simplified Schematic: All Connections and Decoupling Not Shown)
Rev. 0
Circuits from the Lab⢠circuits from Analog Devices have been designed and built by Analog Devices
engineers. Standard engineering practices have been employed in the design and construction of
each circuit, and their function and performance have been tested and verified in a lab environment at
room temperature. However, you are solely responsible for testing the circuit and determining its
suitability and applicability for your use and application. Accordingly, in no event shall Analog Devices
be liable for direct, indirect, special, incidental, consequential or punitive damages due to any cause
whatsoever connected to the use of any Circuits from the Lab circuits. (Continued on last page)
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A.
Tel: 781.329.4700
www.analog.com
Fax: 781.461.3113
©2012 Analog Devices, Inc. All rights reserved.
|
▷ |