SWRA370 Datasheet, PDF (1/34 Pages) Texas Instruments – Basic RF Testing of CCxxxx Devices

Application Report
SWRA370 – August 2011
Basic RF Testing of CCxxxx Devices
Abhishek Chattopadhyay .................................................................................. Low-Power RF Products
ABSTRACT
This document presents users of Texas Instruments' low-power RF products with an overview of the
different characterization tests (conducted, not radiated) that are performed during the device verification
process. The document covers the basic setup of the test system and gives procedural information about
each test.
Throughout this document, the term CCxxxx refers to the low-power CC25xx, CC11xx, CC10XX, and
CC24xx RF device families.
Keywords:
• RF Testing
• RX Test
• Conformance Testing
• Output Power
• SmartRF Studio
• TX Test
• Characterization Test
• Sensitivity
SmartRF is a trademark of Texas Instruments.
Apple, Macintosh are registered trademarks of Apple Inc.
Bluetooth is a registered trademark of Bluetooth SIG.
Linux is a registered trademark of Linus Torvalds.
Microsoft, Windows are registered trademarks of Microsoft Corporation.
LabVIEW is a trademark of National Instruments.
ZigBee is a registered trademark of Zigbee Alliance.
All other trademarks are the property of their respective owners.
SWRA370 – August 2011
Submit Documentation Feedback
Basic RF Testing of CCxxxx Devices
1
Copyright © 2011, Texas Instruments Incorporated