SWS17101 Datasheet, PDF (1/8 Pages) JDS Uniphase Corporation – Swept Wavelength System

COMMUNICATIONS TEST & MEASUREMENT
Swept Wavelength System
SWS2000 Series
Key Features
• Scalable architecture - add more stations any time
• ± 0.002 nm absolute wavelength accuracy
• Up to 128 detector channels available per station
• Remote source laser can be shared by up to 8 workstations
• High speed scanning (user controllable) up to 40 nm/s
• Flexible easy-to-use software
• Customized applications through dynamic link libraries (DLLs)
• 24/7 service and support
Applications
• Optical component and module
characterization in both R&D and
manufacturing environments
- ROADMs, Wavelength Switches,
Wavelength Blockers
- Circuit Packs
- Dense wavelength division
multiplexing (DWDM)
- Tunable Filters, Couplers,
Splitters, Switches, Attenuators,
Fiber Bragg Gratings (FBGs),
Interleavers, Dichroic Filters
- Micro-Electro-Mechanical
Systems (MEMS) and
Waveguide Devices
- Complies with IEC 61300-3-29,
IEC 61300-3-12
Safety Information
• Complies to CE requirements plus
UL3101.1 and CAN/CSA - C22.2 No.
1010.1. The laser source in the
Source Optics Module (SWS20010)
is a class 1. The Tunable Laser Source
(SWS17101) is a class 3B laser. Both
are classified per IEC standard
60825-1(2002) and comply with
21CFR1040.10 except deviations
per Laser Notice No. 50, July 2001.
The Swept Wavelength System SWS2000 series remains the industry standard
solution for measuring insertion loss (IL), polarization dependent loss (PDL),
return loss (RL) and directivity with high wavelength resolution in both research
and development (R&D) and production environments. Currently used at more
than 80 customer sites, with over 8500 detector channels deployed, the SWS test
platform validates optical performance for the latest in optical components and
modules including: ROADMs, Wavelength Switches, Tunable Filters and Circuit
Packs. The SWS system consists of a tunable laser source, a source optics module
(SOM), a control module, a receiver chassis, one or more detector modules and
application software.
With a ± 0.002 nm absolute wavelength accuracy over the entire 1520 to
1630 nm range, a high sweep speed of 40 nm/s, and a deep dynamic range of
> 70 dB, the SWS2000 provides excellent performance combined with a low cost
of ownership; the distributed architecture supports up to eight separate,
individually controlled measurement stations per source laser. Often purchased
initially as an R&D tool, this scalability in the number of measurement stations
provides customers the flexibility to transition the equipment from R&D to production.
Upgrade packages from legacy SWS systems to the SWS2000 platform are
available to ensure that existing SWS users receive the maximum benefit from
their existing capital infrastructure.
WEBSITE: www.jdsu.com