W78M32V-XBX Datasheet, PDF (42/54 Pages) White Electronic Designs Corporation – 8Mx32 Flash 3.3V Page Mode Simultaneous Read/Write Operation Multi-Chip Package

White Electronic Designs
W78M32V-XBX
FIG 10:
AC TEST CIRCUIT
AC TEST CONDITIONS
I_OL
Current Source
D.U.T.
C_EFF = 50 pf
Current Source
I_OH
Parameter
Typ
Unit
Input Pulse Levels
VIL - 0, VIH = 2.5
V
Input Rise and Fall
5
ns
Input and Output Reference Level
1.5
V
Output Timing Reference Level
1.5
V
V_Z~ 1.5v
(Bipolar Supply)
Notes:
VZ is programmable from -2V to +7V.
IOL & IOH programmable from 0 to 16 mA.
Tester Impedance Z0 = 50Ω.
VZ is typically the midpoint of VOH and VOL.
IOL & IOH are adjusted to similate a typical resistive load circuit.
ATE tester Includes jig capacitance.
AC CHARACTERISTICS - READ-ONLY OPERATIONS
VCC = 3.3V ± 0.3V, -55°C ≤ TA ≤ +125°C
Parameter
Read Cycle Time (3)
Address Access Time
Chip Select Access Time
Page Access Time
Output Enable to Output Valid
Chip Select High to Output High Z
Output Enable High to Output High Z
Output Hold from Addresses, CS# or OE#
Change, Whichever occurs first
Output Enable Hold
Time (1)
Read
Toggle and
Data# Polling
Symbol
tAVAV
tAVQV
tELQV
tOLQV
tEHQZ
tGHQZ
tAXQX
tRC
tACC
tCE
tPACC
tOE
tDF
tDF
tOH
tOEH
-70
-90
-100
-120
Unit
Min Max Min Max Min Max Min Max
70
90
100
120
ns
70
90
100
120 ns
70
90
100
120 ns
25
25
100
120 ns
30
40
40
50
ns
20
20
20
20
ns
20
20
20
20
ns
5
5
5
5
ns
0
0
0
0
10
10
10
10
1. Guaranteed by design, not tested.
White Electronic Designs Corp. reserves the right to change products or specifications without notice.
April 2006
Rev. 3
42
White Electronic Designs Corporation • [phone] • www.wedc.com