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DG406_11 Datasheet, PDF (5/16 Pages) Vishay Siliconix – 16-Ch/Dual 8-Ch High-Performance CMOS Analog Multiplexers
DG406, DG407
Vishay Siliconix
SPECIFICATIONSa (for Single Supply)
Parameter
Analog Switch
Analog Signal Rangee
Drain-Source
On-Resistance
RDS(on) Matching Between
Channelsg
Symbol
Test Conditions
Unless Otherwise Specified
V+ = 12 V, V- = 0 V
VAL = 0.8 V, VAH = 2.4 Vf
A Suffix
D Suffix
- 55 °C to 125 °C - 40 °C to 85 °C
Temp.b Typ.c Min.d Max.d Min.d Max.d Unit
VANALOG
Full
0
12
0
12
V
RDS(on)
RDS(on)
VD = 3 V, 10 V, IS = - 1 mA
sequence each switch on
Room 90
Room 5
120
120 
%
Source Off Leakage Current
IS(off)
VEN = 0 V
Room 0.01
Drain Off Leakage Current
ID(off)
VD = 10 V or 0.5 V DG406 Room 0.04
VS = 0.5 V or 10 V DG407 Room 0.04
nA
VS = VD = ± 10
DG406 Room 0.04
Drain On Leakage Current
ID(on)
sequence each
switch on
DG407 Room 0.04
Dynamic Characteristics
Switching Time of Multiplexer
Enable Turn-On Time
Enable Turn-Off Time
Charge Injection
Power Supplies
tOPEN VS1 = 8 V, VS8 = 0 V, VIN = 2.4 V Room 300
tON(EN)
tOFF(EN)
VINH = 2.4 V, VINL = 0 V
VS1 = 5 V
Room 250
Room 150
Q
CL = 1 nF, VS = 6 V, RS = 0 Room 20
450
450
600
600 ns
300
300
pC
Positive Supply Current
Negative Supply Current
I+
Room 13
Full
I-
VEN = 0 V or 5 V, VA = 0 V or 5 V Room
Full
- 0.01
- 20
- 20
30
30
75
75
µA
- 20
- 20
Notes:
a. Refer to PROCESS OPTION FLOWCHART.
b. Room = 25 °C, Full = as determined by the operating temperature suffix.
c. Typical values are for DESIGN AID ONLY, not guaranteed nor subject to production testing.
d. The algebraic convention whereby the most negative value is a minimum and the most positive a maximum, is used in this data sheet.
e. Guaranteed by design, not subject to production test.
f. VIN = input voltage to perform proper function.
g. RDS(on) = RDS(on) max. - RDS(on) min.
h. Worst case isolation occurs on Channel 4 due to proximity to the drain pin.
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation
of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum
rating conditions for extended periods may affect device reliability.
Document Number: 70061
S11-0179-Rev. J, 07-Feb-11
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