DG406B Datasheet, PDF (5/11 Pages) Vishay Siliconix – 16-Ch/Dual 8-Ch High-Performance CMOS Analog Multiplexers

DG406B/407B
Vishay Siliconix
SPECIFICATIONS FOR SINGLE SUPPLY
Parameter
Analog Switch
Symbol
Test Conditions
Unless Otherwise Specified
V+ = 12 V, V- = 0 V
V_AL = 0.8 V, V_AH = 2.4 V^f
Temp^b
Typ^c
A Suffix
- 55 to 125 °C
Min^d Max^d
D Suffix
- 40 to 85 °C
Min^d Max^d
Unit
Analog Signal Range^e
Drain-Source
On-Resistance
r_DS(on) Matching Between
Channels^g
Source Off Leakage Current^a
Drain Off Leakage Current^a
Drain On Leakage Current^a
V_ANALOG
r_DS(on)
Δr_DS(on)
V_D = 3 V, I_S = - 1 mA
Sequence Each Switch On
Full
Room 78
Room 5
0
12
0
12
V
100
100 Ω
%
I_S(off)
I_D(off)
I_D(on)
V_EN = 0 V
V_D = 10 V or 0.5 V
V_S = 0.5 V or 10 V
V_S = V_D = ± 10 V
Sequence Each
Switch On
DG406B
DG407B
DG406B
Room
Room
Room
Room
DG407B Room
- 0.5 0.5 - 0.5 0.5
-1
1
-1
1
-1
1
-1
1
nA
-1
1
-1
1
-1
1
-1
1
Dynamic Characteristics
Switching Time of Multiplexer
Enable Turn-On Time
Enable Turn-Off Time
Charge Injection
Power Supplies
Positive Supply Current
Negative Supply Current
t_TRANS V_S1 = 8 V, V_S8 = 0 V, V_IN = 2.4 V Room 130
163
163
t_ON(EN)
V_INH = 2.4 V, V_INL = 0 V
Room 93
125
125 ns
t_OFF(EN)
V_S1 = 5 V
Room 63
94
94
Q
C_L = 1 nF, V_S = 6 V, R_S = 0 Room 9
pC
I+
I-
Room 13
30
V_EN = 0 V or 5 V, V_A = 0 V or 5 V
Full
Room
- 0.01
- 20
75
- 20
Full
- 20
- 20
30
75
µA
Notes:
a. Guaranteed by ± 15 V leakage test, not production tested.
b. Room = 25 °C, Full = as determined by the operating temperature suffix.
c. Typical values are for DESIGN AID ONLY, not guaranteed nor subject to production testing.
d. The algebraic convention whereby the most negative value is a minimum and the most positive a maximum, is used in this data sheet.
e. Guaranteed by design, not subject to production test.
f. V_IN = input voltage to perform proper function.
g. Δr_DS(on) = r_DS(on) MAX - r_DS(on) MIN.
h. Worst case isolation occurs on Channel 4 due to proximity to the drain pin.
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation
of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum
rating conditions for extended periods may affect device reliability.
Document Number: 72552
S-71061–Rev. B, 21-May-07
www.vishay.com
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