DG406 Datasheet, PDF (5/12 Pages) Intersil Corporation – Single 16-Channel/Differential 8-Channel, CMOS Analog Multiplexers

DG406/407
Vishay Siliconix
SPECIFICATIONS^a (FOR SINGLE SUPPLY)
Parameter
Analog Switch
Symbol
Test Conditions
Unless Otherwise Specified
V+ = 12 V, V- = 0 V
V_AL = 0.8 V, V_AH = 2.4 V^f
A Suffix
D Suffix
- 55 to 125 °C - 40 to 85 °C
Temp^b Typ^c Min^d Max^d Min^d Max^d Unit
Analog Signal Range^e
V_ANALOG
Full
0
12
0
12
V
Drain-Source
On-Resistance
r_DS(on)
r_DS(on) Matching Between Channels^{g Δr}DS(on)
V_D = 3 V, 10 V, I_S = - 1 mA
Sequence Each Switch On
Room 90
Room 5
120
120 Ω
%
Source Off Leakage Current
I_S(off)
V_EN = 0 V
Room 0.01
Drain Off Leakage Current
I_D(off)
V_D = 10 V or 0.5 V DG406 Room 0.04
V_S = 0.5 V or 10 V _{DG407 Room 0.04}
nA
V_S = V_D = ± 10
DG406 Room 0.04
Drain On Leakage Current
I_D(on)
Sequence Each
Switch On
DG407 Room 0.04
Dynamic Characteristics
Switching Time of Multiplexer
t_OPEN V_S1 = 8 V, V_S8 = 0 V, V_IN = 2.4 V Room 300
450
450
Enable Turn-On Time
t_ON(EN)
V_INH = 2.4 V, V_INL = 0 V
Room 250
600
600 ns
Enable Turn-Off Time
t_OFF(EN)
V_S1 = 5 V
Room 150
300
300
Charge Injection
Q
C_L = 1 nF, V_S = 6 V, R_S = 0 Room 20
pC
Power Supplies
Positive Supply Current
Negative Supply Current
I+
I-
Room 13
V_EN = 0 V or 5 V, V_A = 0 V or 5 V
Full
Room
Full
- 0.01
- 20
- 20
30
75
- 20
- 20
30
75
µA
Notes:
a. Refer to PROCESS OPTION FLOWCHART.
b. Room = 25 °C, Full = as determined by the operating temperature suffix.
c. Typical values are for DESIGN AID ONLY, not guaranteed nor subject to production testing.
d. The algebraic convention whereby the most negative value is a minimum and the most positive a maximum, is used in this data sheet.
e. Guaranteed by design, not subject to production test.
f. V_IN = input voltage to perform proper function.
g. Δr_DS(on) = r_DS(on) MAX - r_DS(on) MIN.
h. Worst case isolation occurs on Channel 4 due to proximity to the drain pin.
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation
of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum
rating conditions for extended periods may affect device reliability.
Document Number: 70061
S-71009–Rev. I, 14-May-07
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