DG458_08 Datasheet, PDF (4/10 Pages) Vishay Siliconix – Fault-Protected Single 8-Ch/Differential 4-Ch Analog Multiplexers

DG458/459
Vishay Siliconix
SPECIFICATIONS^a
Parameter
Dynamic Characteristics
Transition Time
Break-Before-Make Interval
Enable Turn-On Time
Enable Turn-Off Time
Settling Time
Off Isolation
Logic Input Capacitance
Source Off Capacitance
Drain Off Capacitance
Symbol
Test Conditions
A Suffix
D Suffix
Unless Otherwise Specified
- 55 to 125 °C - 40 to 85 °C
V+ = 15 V, V- = - 15 V
V_AL = 0.8 V, V_AH = 2.4 V^f
Temp^b Typ^c Min^d Max^d Min^d Max^d Unit
t_A
t_OPEN
t_ON(EN)
t_OFF(EN)
t_s
OIRR
C_in
C_S(off)
C_D(off)
See Figure 3
Room 200
500
500
See Figure 4
Room 45
10
10
Room 140
250
250 _ns
Full
500
500
See Figure 5
Room 50
250
250
Full
500
500
To 0.1 %
Room 0.5
µs
To 0.01 %
Room 1.5
V_EN = 0 V, R_L = 1 kΩ
C_L = 15 pF, V_S = 3 V_RMS
Room 90
dB
f = 100 kHz
f = 1 MHz
Room 5
Room 5
DG458 Room 15
pF
DG459 Room 10
Drain On Capacitance
C_D(on)
DG458 Room 40
DG459 Room 35
Power Supplies
Positive Supply Current
Negative Supply Current
Power Supply Range for
Continuous Operation
I+
I-
V_EN = 5.0 or 0 V, V_A = 0 V
Room 0.05
0.1
Full
0.2
Room - 0.01 - 0.1
- 0.1
Full
- 0.2
- 0.2
0.1
0.2 _mA
Room
± 4.5 ± 18 ± 4.5 ± 18 V
Notes:
a. Refer to PROCESS OPTION FLOWCHART.
b. Room = 25 °C, Full = as determined by the operating temperature suffix.
c. Typical values are for DESIGN AID ONLY, not guaranteed nor subject to production testing.
d. The algebraic convention whereby the most negative value is a minimum and the most positive a maximum, is used in this data sheet.
e. Guaranteed by design, not subject to production test.
f. V_IN = input voltage to perform proper function.
g. When the analog signal exceeds the + 13.5 V or - 12 V, r_DS(on) starts to rise until only leakage currents flow.
( ) ^{h. ΔrDS(on) =}
r_DS(on) MAX - r_DS(on) MIN
r_DS(on) AVE
x 100 %
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation
of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum
rating conditions for extended periods may affect device reliability.
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Document Number: 70064
S-71155–Rev. G, 11-Jun-07