DG454_09 Datasheet, PDF (4/12 Pages) Vishay Siliconix – High Voltage 4-ohm Quad SPST CMOS Analog Switch

DG454, DG455, DG456
Vishay Siliconix
SPECIFICATIONS FOR DUAL SUPPLIES
Parameter
Power Supplies
Symbol
Test Conditions
Unless Specified
V+ = 5 V, V- = - 5 V
V_IN = 2.4 V, 0.8 V^a
Power Supply Current
I+
Negative Supply Current
I-
V_IN = 0 or 5 V
Ground Current
I_GND
- 40 °C to 125 °C - 40 °C to 85 °C
Temp.^b Typ.^c Min.^d Max.^d Min.^d Max.^d Unit
Room
14
Full
100
100
100
100
Room - 0.001 - 0.5
Full
-5
- 0.5
-5
µA
Room - 14 - 100
Full
- 100
- 100
- 100
SPECIFICATIONS FOR UNIPOLAR SUPPLIES
Parameter
Analog Switch
Analog Signal Range^e
On-Resistance
On-Resistance Match
On-Resistance Flatness
Dynamic Characteristics
Turn-On Time
Turn-Off Time
Break-Before-Make
Time Delay
Charge Injection^e
Power Supplies
Power Supply Current
Negative Supply Current
Ground Current
Symbol
Test Conditions
Unless Specified
V+ = 12 V, V- = 0 V
V_IN = 2.4 V, 0.8 V^a
- 40 °C to 125 °C - 40 °C to 85 °C
Temp.^b Typ.^c Min.^d Max.^d Min.^d Max.^d Unit
V_ANALOG
R_ON I_S = - 10 mA, V_D = 0 V to + 10 V
ΔR_ON
R_FLATNESS
I_S = - 10 mA, V_D = + 10 V
I_S = - 10 mA,
V_D = 0 V, + 5 V, + 10 V
Full
Room
Full
Room
Full
Room
Full
5.5
0.14
0.94
12
12
V
8.1
8.1
12.4
10.4
0.5
1
0.5
0.5
Ω
1.5
1.5
1.7
1.5
t_ON
R_L = 300 Ω, C_L = 35 pF
Room 132
Full
t_OFF
V_S = 8 V, See Figure 2
Room
61
Full
t_D
DG456 only, V_S = 8 V
R_L = 300 Ω, C_L = 35 pF
Room
70
Q
V_g = 0 V, R_g = 0 Ω, C_L = 1 nF Room
1
162
162
238
210
91
117
91
105
ns
pC
I+
I-
I_GND
V+ = 13.5 V, V- = 0 V
V_IN = 0 or 5 V
Room
25
Full
100
100
100
100
Room - 0.001 - 0.5
Full
-5
- 0.5
-5
µA
Room - 25 - 100
Full
- 100
- 100
- 100
Notes:
a. V_IN = input voltage to perform proper function.
b. Room = 25 °C, Full = as determined by the operating temperature suffix.
c. Typical values are for DESIGN AID ONLY, not guaranteed nor subject to production testing.
d. The algebraic convention whereby the most negative value is a minimum and the most positive a maximum, is used in this data sheet.
e. Guaranteed by design, not subject to production test.
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation
of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum
rating conditions for extended periods may affect device reliability.
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Document Number: 74473
S09-2549-Rev. E, 30-Nov-09