DG451_09 Datasheet, PDF (4/12 Pages) Vishay Siliconix – High Voltage 4-ohm Quad SPST CMOS Analog Switch

DG451, DG452, DG453
Vishay Siliconix
SPECIFICATIONS FOR DUAL SUPPLIES
Parameter
Power Supplies
Symbol
Test Conditions
Unless Specified
V+ = 5 V, V- = - 5 V
V_L = 5 V, V_IN = 2.4 V, 0.8 V^a
Power Supply Current
I+
Negative Supply Current
Logic Supply Current
Ground Current
I-
I_L
I_GND
V_L = 5 V, V_IN = 0 or 5 V
- 40 °C to 125 °C - 40 °C to 85 °C
Temp.^b Typ.^c Min.^d Max.^d Min.^d Max.^d Unit
Room 0.001
Full
- 0.5
-5
- 0.5
-5
Room - 0.001 - 0.5
- 0.5
Full
Room
0.001
-5
- 0.5
-5
µA
- 0.5
Full
-5
-5
Room - 0.001 - 0.5
Full
-5
- 0.5
-5
SPECIFICATIONS FOR UNIPOLAR SUPPLIES
Parameter
Analog Switch
Symbol
Test Conditions
Unless Specified
V+ = 12 V, V- = 0 V
V_L = 5 V, V_IN = 2.4 V, 0.8 V^a
Temp.^b
Typ.^c
- 40 °C to 125 °C - 40 °C to 85 °C
Min.^d Max.^d Min.^d Max.^d Unit
Analog Signal Range^e
V_ANALOG
Full
12
12
V
On-Resistance
R_ON
I_S = - 10 mA, V_D = 0 V to + 10 V
Room
Full
5.5
8.1
8.1
12.4
10.4
On-Resistance Match
ΔR_ON
I_S = - 10 mA, V_D = + 10 V
Room
Full
0.14
0.5
1
0.5
0.5
Ω
On-Resistance Flatness
R_FLATNESS
I_S = - 10 mA,
V_D = 0 V, + 5 V, + 10 V
Room 0.94
Full
1.5
1.7
1.5
1.5
Dynamic Characteristics
Turn-On Time
Turn-Off Time
t_ON
R_L = 300 Ω, C_L = 35 pF
Room 132
Full
t_OFF
V_S = 8 V, See Figure 2
Room
61
Full
162
162
238
210
91
117
91
105
ns
Break-Before-Make
Time Delay
t_D
DG453 only, V_S = 8 V
R_L = 300 Ω, C_L = 35 pF
Room
70
Charge Injection^e
Q
V_g = 0 V, R_g = 0 Ω, C_L = 1 nF Room
1
pC
Power Supplies
Power Supply Current
I+
Room 0.001
0.5
0.5
Full
5
5
Negative Supply Current
Logic Supply Current
I-
Room - 0.001 - 0.5
Full
-5
- 0.5
-5
I_L
V_L = 5 V, V_IN = 0 or 5 V
Room 0.001
Full
0.5
5
µA
0.5
5
Ground Current
I_GND
Room - 0.001 - 0.5
Full
-5
- 0.5
-5
Notes:
a. V_IN = input voltage to perform proper function.
b. Room = 25 °C, Full = as determined by the operating temperature suffix.
c. Typical values are for DESIGN AID ONLY, not guaranteed nor subject to production testing.
d. The algebraic convention whereby the most negative value is a minimum and the most positive a maximum, is used in this data sheet.
e. Guaranteed by design, not subject to production test.
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation
of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum
rating conditions for extended periods may affect device reliability.
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Document Number: 74470
S09-2550-Rev. E, 30-Nov-09