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DG418BDQ-T1 Datasheet, PDF (4/16 Pages) Vishay Siliconix – Precision Monolithic Quad SPST CMOS Analog Switches
DG417B, DG418B, DG419B
Vishay Siliconix
SPECIFICATIONSa
Parameter
Dynamic Characteristics
Source Off Capacitancee
Drain Off Capacitancee
Symbol
CS(off)
CD(off)
Channel On Capacitancee
Power Supplies
Positive Supply Current
Negative Supply Current
Logic Supply Current
Ground Current
CD(on)
I+
I-
IL
IGND
Test Conditions
Unless Otherwise Specified
V+ = 15 V, V- = - 15 V
VL = 5 V, VIN = 2.4 V, 0.8 Vf
A Suffix
D Suffix
- 55 °C to 125 °C - 40 °C to 85 °C
Temp.b Typ.c Min.d Max.d Min.d Maxd. Unit
Room 12
f = 1 MHz, VS = 0 V
DG417B
DG418B
Room
12
pF
f = 1 MHz, VS = 0 V
DG417B
DG418B
Room
50
DG419B Room 57
V+ = 16.5 V, V- = - 16.5 V
VIN = 0 or 5 V
Room 0.001
1
1
Full
5
5
Room - 0.001 - 1
-1
Full
-5
Room 0.001
1
-5
1
µA
Full
5
5
Room - 0.001 - 1
-1
Full
-5
-5
SPECIFICATIONSa
Parameter
Analog Switch
Analog Signal Rangee
Drain-Source
On-Resistance
Dynamic Characteristics
Turn-On Time
Symbol
VANALOG
RDS(on)
tON
Turn-Off Time
Break-Before-Make
Time Delay
Transition Time
Charge Injection
Power Supplies
Positive Supply Current
tOFF
tD
tTRANS
Q
I+
Negative Supply Current
I-
Logic Supply Current
Ground Current
IL
IGND
Test Conditions
Unless Otherwise Specified
V+ = 12 V, V- = 0 V
VL = 5 V, VIN = 2.4 V, 0.8 Vf
IS = - 10 mA, VD = 3.8 V
V+ = 10.8 V
A Suffix
D Suffix
- 55 °C to 125 °C - 40 °C to 85 °C
Temp.b Typ.c Min.d Max.d Min.d Max.d Unit
Full
0
12
0
12 V
Room
Full
26
35
52
35
45
Ω
RL = 300 Ω, CL = 35 pF
VS = 8 V, See Switching
Time Test Circuit
Room
Full 100
Room
Full
38
125
125
155
143
66
66
73
69
ns
RL = 300 Ω, CL = 35 pF DG419B Room 62
25
25
RL = 300 Ω, CL = 35 pF
VS1 = 0 V, 8 V, VS2 = 8 V, 0 V
Room
Full
95
CL = 10 nF, Vgen = 0 V, Rgen = 0 Ω Room 18
119
119
153
141
pC
V+ = 13.2 V, VL = 5.25 V
VIN = 0 or 5 V
Room
Full
0.001
1
5
1
5
Room - 0.001
-1
-5
-1
-5
µA
Room 0.001
1
5
1
5
Room - 0.001
-1
-5
-1
-5
Notes:
a. Refer to PROCESS OPTION FLOWCHART.
b. Room = 25 °C, full = as determined by the operating temperature suffix.
c. Typical values are for DESIGN AID ONLY, not guaranteed nor subject to production testing.
d. The algebraic convention whereby the most negative value is a minimum and the most positive a maximum, is used in this datasheet.
e. Guaranteed by design, not subject to production test.
f. VIN = input voltage to perform proper function.
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation
of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum
rating conditions for extended periods may affect device reliability.
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Document Number: 72107
S09-1261-Rev. D, 13-Jul-09