DG411HS Datasheet, PDF (4/9 Pages) Vishay Siliconix – Precision Monolithic Quad SPST CMOS Analog Switches

DG411HS/412HS/413HS
Vishay Siliconix
SPECIFICATIONS^a
Parameter
Symbol
Dynamic Characteristics (Cont’d)
Test Conditions
Unless Specified
V+ = 15 V, V- = - 15 V
V_L = 5 V, V_IN = 2.4 V, 0.8 V^f
Temp^b
Typ^c
A Suffix
- 55 to 125 °C
Min^d Max^d
D Suffix
- 40 to 85 °C
Min^d Max^d
Unit
Off Isolation^e
Channel-to-Channel Crosstalk^e
OIRR
X_TALK
R_L = 50 Ω, C_L = 5 pF
f = 1 MHz
Room - 91
Room - 88
dB
Source Off Capacitance^e
C_S(off)
Room
12
Drain Off Capacitance^e
C_D(off)
f = 1 MHz
Room
12
pF
Channel On Capacitance^e
Power Supplies
C_D(on)
Room
30
Positive Supply Current
I+
Room 0.0001
1
1
Full
5
5
Negative Supply Current
Logic Supply Current
I-
I_L
Room - 0.0001 - 1
-1
V+ = 16.5 V, V- = - 16.5 V
Full
-5
V_IN = 0 or 5 V
Room 0.0001
1
-5
µA
1
Full
5
5
Ground Current
I_GND
Room - 0.0001 - 1
-1
Full
-5
-5
SPECIFICATIONS^a FOR UNIPOLAR SUPPLIES
Parameter
Symbol
Test Conditions
Unless Specified
V+ = 12 V, V- = 0 V
V_L = 5 V, V_IN = 2.4 V, 0.8 V^f
Temp^b
Typ^c
A Suffix
- 55 to 125 °C
Min^d Max^d
D Suffix
- 40 to 85 °C
Min^d Max^d
Unit
Analog Switch
Analog Signal Range^e
V_ANALOG
Full
12
12
V
Drain-Source On-Resistance
r_DS(on)
V+ = 10.8 V, I_S = - 10 mA
V_D = 3 V, 8 V
Room
Full
49
Dynamic Characteristics
80
100
80
100
Ω
Turn-On Time
Turn-Off Time
t_ON
Room
95
R_L = 300 Ω, C_L = 35 pF
Hot
t_OFF
V_S = 8 V, See Figure 2
Room
36
Hot
140
140
180
160
70
79
70
74
ns
Break-Before-Make
Time Delay
t_D
DG413HS Only, V_S = 8 V
R_L = 300 Ω, C_L = 35 pF
Room
60
Charge Injection
Q
V_g = 6 V, R_g = 0 Ω, C_L = 1 nF Room
60
pC
Power Supplies
Positive Supply Current
I+
Room 0.0001
1
1
Hot
5
5
Negative Supply Current
Logic Supply Current
I-
I_L
Room - 0.0001 - 1
V+ = 13.2 V, V_IN = 0 or 5 V
Hot
Room 0.0001
-5
Hot
1
5
-1
-5
µA
1
5
Ground Current
I_GND
Room - 0.0001 - 1
-1
Hot
-5
-5
Notes:
a. Refer to PROCESS OPTION FLOWCHART.
b. Room = 25 °C, Full = as determined by the operating temperature suffix.
c. Typical values are for DESIGN AID ONLY, not guaranteed nor subject to production testing.
d. The algebraic convention whereby the most negative value is a minimum and the most positive a maximum, is used in this data sheet.
e. Guaranteed by design, not subject to production test.
f. V_IN = input voltage to perform proper function.
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation
of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum
rating conditions for extended periods may affect device reliability.
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Document Number: 72053
S-71155-Rev. B, 11-Jun-07