DG2799_08 Datasheet, PDF (4/10 Pages) Vishay Siliconix – Low Voltage, Low On-Resistance, Dual DPDT Analog Switch

DG2799
Vishay Siliconix
SPECIFICATIONS (V+ = 4.3 V)
Parameter
Analog Switch
Analog Signal Range^d
On-Resistance
r_ON Flatness^d
r_ON Match^d
Switch Off Leakage
Current^d
Channel-On Leakage
Current^d
Digital Control
Input High Voltage
Input Low Voltage
Input Capacitance
Input Current
Dynamic Characteristics
Charge Injection^d
Off-Isolation^d
Crosstalk^d
N_O, N_C Off Capacitance^d
Channel-On Capacitance^d
Power Supply
Power Supply Range
Power Supply Current
Symbol
Test Condition
Otherwise Unless Specified
V+ = 4.3 V, V_IN = 0.5 or 1.6 V^e
Temp^a
V_NO, V_NC,
V_COM
r_ON
r_ON
Flatness
∆r_ON
I_NO(off),
I_NC(offF)
I_COM(off)
I_COM(on)
V+ = 4.3 V, V_COM = 0.5 V, I_NO, I_NC = 100 mA
V+ = 4.3 V, V_COM = 2.1 V, I_NO, I_NC = 100 mA
V+ = 4.3 V, V_COM = 0 to V+,
I_NO, I_NC = 100 mA
V+ = 4.3 V, V_NO, V_NC = 0.3 V / 4.0 V,
V_COM = 4.0 V / 0.3 V
V+ = 4.3 V, V_NO, V_NC = V_COM = 3.0 V / 4.0 V
Full
Room
Full
Room
Room
Room
Full
Room
Full
Room
Full
V_INH
V_INL
C_in
I_INL or I_INH
Q_INJ
OIRR
X_TALK
C_NO(off)
C_NC(off)
C_NO(on)
C_NC(on)
V+
I+
V_IN = 0 or V+
C_L = 1 nF, V_GEN = 0 V, R_GEN = 0 Ω
R_L = 50 Ω, C_L = 5 pF, f = 100 kHz
V_IN = 0 or V+, f = 1 MHz
V_IN = 0 or V+
Full
Full
Full
Full
Room
Room
Room
Room
Room
Room
Room
Full
Limits
–40 to 85°C
Min^b
Typ^c
Max^b
0
V+
0.29
0.43
0.21
0.53
0.07
0.15
0.05
–10
10
–100
100
–10
10
–100
100
–10
10
–100
100
1.6
0.5
6
–1
1
320
–73
–73
100
100
230
230
4.3
1.0
Unit
V
Ω
nA
V
pF
µA
pC
dB
pF
V
µA
Notes
a. Room = 25°C, Full = as determined by the operating suffix.
b. The algebraic convention whereby the most negative value is a minimum and the most positive a maximum, is used in this data sheet.
c. Typical values are for design aid only, not guaranteed nor subject to production testing.
d. Guarantee by design, not subjected to production test.
e. V_IN = input voltage to perform proper function.
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation
of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum
rating conditions for extended periods may affect device reliability.
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Document Number: 72922
S-52336–Rev. F, 07-Nov-05