DG2788 Datasheet, PDF (4/9 Pages) Vishay Siliconix – Low Voltage, Low On-Resistance, Dual DPDT/Quad SPDT Analog Switch

DG2788/DG2789
Vishay Siliconix
SPECIFICATIONS (V+ = 4.3 V)
Parameter
Analog Switch
Symbol
Test Conditions
Otherwise Unless Specified
V+ = 4.3 V, V_IN = 0.5 or 1.6 V^e
Temp^a
Limits
- 40 to 85 °C
Min^b
Typ^c
Max^b
Unit
Analog Signal Range^d
On-Resistance
r_ON Flatness^d
r_ON Match^d
Switch Off Leakage
Current^d
V_NO, V_NC,
V_COM
Full
0
V+
V
V+ = 4.3 V, V_COM = 0.9 V, I_NO, I_NC = 100 mA
r_ON
Room
V+ = 4.3 V, V_COM = 2.5 V, I_NO, I_NC = 100 mA
0.32
0.45
0.27
r_ON
Flatness
Δr_ON
V+ = 4.3 V, V_COM = 0 to V+,
I_NO, I_NC = 100 mA
Full
Room
Room
0.5
Ω
0.1
0.15
0.03
I_NO(off),
I_NC(offF)
I_COM(off)
V+ = 4.3 V, V_NO, V_NC = 0.3 V / 4.0 V,
V_COM = 4.0 V / 0.3 V
Room
Full
Room
Full
-10
- 100
- 10
- 100
10
100
10
100
nA
Channel-On Leakage
Current^d
I_COM(on)
V+ = 4.3 V, V_NO, V_NC = V_COM = 3.0 V / 4.0 V
Room
Full
- 10
- 100
10
100
Digital Control
Input High Voltage
Input Low Voltage
Input Capacitance
Input Current
Dynamic Characteristics
V_INH
V_INL
C_in
I_INL or I_INH
V_IN = 0 or V+
Full
1.6
Full
V
0.5
Full
6
pF
Full
-1
1
µA
Charge Injection^d
N_O, N_C Off Capacitance^d
Channel-On Capacitance^d
Power Supply
Power Supply Range
Q_INJ
C_NO(off)
C_NC(off)
C_NO(on)
C_NC(on)
V+
C_L = 1 nF, V_GEN = 0 V, R_GEN = 0 Ω
f = 1 MHz
Room
Room
Room
Room
Room
105
pC
79
79
pF
183
183
4.3
V
Power Supply Current
I+
V_IN = 0 or V+
Full
1.0
µA
Notes:
a. Room = 25 °C, Full = as determined by the operating suffix.
b. The algebraic convention whereby the most negative value is a minimum and the most positive a maximum, is used in this data sheet.
c. Typical values are for design aid only, not guaranteed nor subject to production testing.
d. Guarantee by design, not subjected to production test.
e. V_IN = input voltage to perform proper function.
f. Crosstalk measured between channels.
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation
of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum
rating conditions for extended periods may affect device reliability.
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Document Number: 73863
S-70327–Rev. D, 26-Feb-07