DG2741_11 Datasheet, PDF (4/10 Pages) Vishay Siliconix – Low-Voltage, 0.8ohm RON, Dual SPST Analog Switch

DG2741, DG2742, DG2743
Vishay Siliconix
SPECIFICATIONS (V+ = 3.0 V)
Parameter
Analog Switch
Symbol
Test Conditions
Otherwise Unless Specified
V+ = 3 V, ± 10 %, V_IN = 0.5 or 1.4 V^e
Limits
- 40 °C to 85 °C
Temp.^a Min.^b Typ.^c Max.^b Unit
Analog Signal Range^d
V_NO, V_NC
V_COM
Full
0
V+
V
On-Resistance
R_ON
V+ = 2.7 V, V_COM = 0.2 V/1.5 V, I_NO
I_NC = 100 mA
Room
Full
0.4
0.8
0.9
R_ON Flatness
R_ON MatchFlat
R_ON
Flatness
R_ON
V+ = 2.7 V, V_COM = 1.5, 2 V, I_NO, I_NC = 100 mA
Room
Room

0.8 0.18
0.05 0.08
Switch Off Leakage Current
I_NO(off)
I_NC(off)
I_COM(off)
V+ = 3.3 V
V_NO, V_NC = 0.3 V/3 V, V_COM = 3 V/0.3 V
Room - 1
Full - 10
Room - 1
Full - 10
1
10
1
nA
10
Channel-On Leakage Current I_COM(on)
V+ = 3.3 V, V_NO, V_NC = V_COM = 0.3 V/3 V
Room - 1
Full - 10
1
10
Digital Control
Input High Voltage
Input Low Voltage
Input Capacitance^d
V_INH
V_INL
C_in
Full
1.4
Full
V
0.5
Full
5.5
pF
Input Current^f
Dynamic Characteristics
I_INL or I_INH
V_IN = 0 or V+
Full
-1
1
µA
Turn-On Time
Turn-Off Time
t_ON
Room
Full
t_OFF
V_NO or V_NC = 1.5 V, R_L = 50 , C_L = 35 pF
V+ = 2.7 V, figures 1 and 2
Room
Full
20
30
35
ns
18
28
33
Break-Before-Make Time
t_d
Room
1
Charge Injection^d
Q_INJ
C_L = 1 nF, V_GEN = 0 V, R_GEN = 0 , figure 3
Room
5.8
pC
Off-Isolation^d
Crosstalk^d
OIRR
Room
- 56
X_TALK
R_L = 1 k, C_L = 5 pF, f = 1 MHz
Room
- 89
dB
NO, NC Off Capacitance^d
C_NO(off)
C_NC(off)
V+ = 3.6 V, V_IN = 0 or V+, f = 1 MHz
Room
81
pF
Channel-On Capacitance^d
C_ON
Room
103
Power Supply
Power Supply Range
V+
1.5
3.6
V
Power Supply Current
I+
V+ = 3.6 V, V_IN = 0 or V+
0.01
1.0
µA
Notes:
a. Room = 25 °C, Full = as determined by the operating suffix.
b. The algebraic convention whereby the most negative value is a minimum and the most positive a maximum, is used in this data sheet.
c. Typical values are for design aid only, not guaranteed nor subject to production testing.
d. Guarantee by design, nor subjected to production test.
e. V_IN = input voltage to perform proper function.
f. Guaranteed by 3 V leakage testing, not production tested.
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation
of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum
rating conditions for extended periods may affect device reliability.
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Document Number: 72708
S11-0303-Rev. B, 28-Feb-11