DG2037_08 Datasheet, PDF (4/8 Pages) Vishay Siliconix – Low-Voltage, Low rON, Dual SPST Analog Switch

DG2037/2038/2039
Vishay Siliconix
New Product
SPECIFICATIONS (V+ = 5.0 V)
Parameter
Symbol
Test Conditions
Otherwise Unless Specified
V+ = 5 V, ± 10 %, V_IN = 0.8 or 2.4 V^e
Temp^a
Limits
- 40 to 85 °C
Min^b Typ^c Max^b
Unit
Analog Switch
Analog Signal Range^d
On-Resistance
V_NO, V_NC
V_COM
Full
0
r_ON
V+ = 4.5 V, V_COM = 2.5 V, I_NO, I_NC = 10 mA
Room
Full
V+
V
2.5
5
1.6
6
r_ON Flatness^d
r_ON
Flatness
V+ = 4.5 V, V_COM = 2.5 to V+, I_NO, I_NC = 10 mA Room
0.4
Ω
r_ON Match^d
r_ON
Match
V+ = 4.5 V, I_D = 10 mA, V_COM = 2.5 V
Room
0.2
Switch Off Leakage Current
I_NO(off)
I_NC(off)
I_COM(off)
V+ = 5.5 V
V_NO, V_NC = 1 V/4.5 V, V_COM = 4.5 V/1 V
Room - 1
Full - 10
Room - 1
Full - 10
1
10
1
10
nA
Channel-On Leakage Current I_COM(on)
V+ = 5.5 V
V_NO, V_NC = V_COM = 1 V/4.5 V
Room - 1
Full - 10
1
10
Digital Control
Input High Voltage
Input Low Voltage
Input Capacitance
Input Current
Dynamic Characteristics
V_INH
V_INL
C_in
I_INL or I_INH
f = 1 MHz
V_IN = 0 or V+
Full
2.4
Full
V
0.8
Full
8
pF
Full
-1
1
µA
Turn-On Time^d
Turn-Off Time^d
t_ON
V_NO or V_NC = 3 V, R_L = 300 Ω, C_L = 35 pF
Room
Full
t_OFF
Figures 1 and 2
Room
Full
19
30
35
ns
12
22
30
Charge Injection^d
Off-Isolation^d
Crosstalk^d
Q_INJ
C_L = 1 nF, V_GEN = 0 V, R_GEN = 0 Ω, Figure 3 Room
1
pC
OIRR
Room
- 61
X_TALK
R_L = 50 Ω, C_L = 5 pF, f = 1 MHz
Room
- 67
dB
Source-Off Capacitance^d
C_NC/NO(off)
Room
15
Drain-Off Capacitance^d
C_COM(off)
V_IN = 0 or V+, f = 1 MHz
Room
17
pF
Channel-On Capacitance^d
C_ON
Power Supply
Room
35
Power Supply Range
V+
4.5
5.5
V
Power Supply Current
I+
Power Consumption
P_C
V_IN = 0 or V+
0.02
1.0
µA
5.5 µW
Notes:
a. Room = 25 °C, Full = as determined by the operating suffix.
b. The algebraic convention whereby the most negative value is a minimum and the most positive a maximum, is used in this data sheet.
c. Typical values are for design aid only, not guaranteed nor subject to production testing.
d. Guarantee by design, nor subjected to production test.
e. V_IN = input voltage to perform proper function.
f. Not production tested.
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation
of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum
rating conditions for extended periods may affect device reliability.
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Document Number: 72359
S-71035-Rev. B, 21-May-07