DG304B_11 Datasheet, PDF (3/9 Pages) Vishay Siliconix – CMOS Analog Switches

DG304B, DG306B, DG307B
Vishay Siliconix
SPECIFICATIONS^a
Parameter
Analog Switch
Analog Signal Range^e
Drain-Source On-Resistance
Source Off Leakage Current
Drain Off Leakage Current
Drain On Leakage Current
Digital Control
Input Current with
Input Voltage High
Input Current with
Input Voltage Low
Dynamic Characteristics
Turn-On Time
Turn-Off Time
Break-Before-Make Time
Charge Injection
Source-Off Capacitance
Drain-Off Capacitance
Channel-On Capacitance
Input Capacitance
Off-Isolation
Crosstalk (Channel-to-Channel)
Power Supplies
Positive Supply Current
Negative Supply Current
Symbol
V_ANALOG
R_DS(on)
I_S(off)
I_D(off)
I_D(on)
I_INH
I_INL
t_ON
t_OFF
t_OPEN
Q
C_S(off)
C_D(off)
C_D(on)
C_IN
OIRR
X_TALK
I+
I-
Test Conditions
Unless Otherwise Specified
V+ = 15 V, V- = - 15 V
V_IN = 3.5 V or 11 V^f
Limits
- 40 °C to 85 °C
Temp.^b Min.^d Typ.^c Max.^d Unit
V_D = ± 10 V, I_S = 10 mA
V_S = ± 14 V, V_D = ± 14 V
V_D = V_S = ± 14 V
Full
- 15
15
V
Room
Full
30
50
75

Room
Full
-5
- 100
± 0.1
5
100
Room
Full
-5
- 100
± 0.1
5
100
nA
Room
Full
-5
- 200
± 0.1
5
200
V_IN = 5 V
V_IN = 15 V
V_IN = 0 V
Room - 1 - 0.001
Full
Room
Full
0.001
1
µA
Room - 1 - 0.001
Full
see figure 2
DG305A/307A ONLY, see figure 3
C_L = 1 nF, R_gen = 0 , V_gen = 0 V
see figure 4
V_S, V_D = 0 V, f = 1 MHz
f = 1 MHz
V_IN = 0 V
V_IN = 15 V
V_IN = 0 V, R_L = 1 k
V_S = 1 V_rms, f = 500 kHz
V_IN = 15 V or 0 V
(all inputs)
Room
110
Room
70
ns
Room
50
Room
30
pC
Room
14
Room
14
Room
40
pF
Room
6
Room
7
Room
62
dB
Room
74
Room
0.001 100
Full
µA
Room - 100 - 0.001
Full
Notes:
a. Refer to PROCESS OPTION FLOWCHART.
b. Room = 25 °C, Full = as determined by the operating temperature suffix.
c. Typical values are for DESIGN AID ONLY, not guaranteed nor subject to production testing.
d. The algebraic convention whereby the most negative value is a minimum and the most positive a maximum, is used in this data sheet.
e. Guaranteed by design, not subject to production test.
f. V_IN = input voltage to perform proper function.
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation
of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum
rating conditions for extended periods may affect device reliability.
Document Number: 71403
S11-0303-Rev. D, 28-Feb-11
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