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DG2753 Datasheet, PDF (3/8 Pages) Vishay Siliconix – Low Voltage, 0.7 Ω, Triple SPDT Analog Switch
DG2753
Vishay Siliconix
SPECIFICATIONS
Parameter
Digital Control
Input High Voltage
Input Low Voltage
Symbol
VINH
VINL
Test Conditions
Otherwise Unless Specified
V+, ± 10 %, VIN = 0.4 or 1.8 Ve
V+ = 1.8 V
V+ = 3 V
V+ = 4.3 V
V+ = 1.8 V
V+ = 3 V
V+ = 4.3 V
Tempa
Limits
- 40 to 85 °C
Minb
Typc
Maxb
Unit
Full
1
Full
1.4
Full
1.8
Full
Full
Full
V
0.4
0.5
0.5
Input Current
Dynamic Characteristics
IINL, IINH
VIN = 0 V or V+
Full
-1
1
µA
Turn-On Time
Turn-Off Time
tON
V+ = 2.7 V
Room
Full
tOFF
VNO, VNC = 1.5 V, RL = 50 Ω, CL = 35 pF
Room
Full
30
60
65
10
30
ns
40
Break-Before-Make
tOPEN
V+ = 2.7 V
Full
5
Adress Transistion Time
tTRANS
VNO, VNC = 1.5 V, RL = 50 Ω, CL = 35 pF
Full
30
40
80
Charge Injectiond
QINJ
V+ = 2.7 V, CL = 1 nF, RGEN = 0 Ω, f = 500 kHz
VNC, VNO = 2 V (test at COM side)
Room
- 25
pC
Off-Isolationd
Crosstalkd
OIRR
V+ = 2.7 V, CL = 1 nF, RGEN = 0 Ω, f = 500 kHz
VNC, VNO = 2 V (test at COM side)
Room
- 90
dB
XTALK
V+ = 2.7 V, CL = 1 nF, RGEN = 0 Ω
VNC, VNO = 2 V (test at COM side)
Room
- 90
NO, NC Off Capacitanced
Channel/On Capacitanced
CNO(off)
CNC(off)
CNO(on)
CNC(on)
VIN = 0 or V+, f = 1 MHz
Room
Room
Room
Room
35
35
80
80
pF
Power Supply
Power Supply Current
I+
VIN = 0 or V+
Full
1
µA
Notes:
a. Room = 25 °C, Full = as determined by the operating suffix.
b. Typical values are for design aid only, not guaranteed nor subject to production testing.
c. The algebraic convention where by the most negative value is a minimum and the most positive a maximum, is used in this datasheet.
d. Guarantee by design, not subjected to production test.
e. VIN = input voltage to perform proper function.
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation
of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum
rating conditions for extended periods may affect device reliability.
Document Number: 73482
S-62653–Rev. B, 01-Jan-07
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