DG2714_08 Datasheet, PDF (3/8 Pages) Vishay Siliconix – Low-Voltage Single SPDT Analog Switch

DG2714
Vishay Siliconix
SPECIFICATIONS (V+ = 3.0 V)
Parameter
Symbol
Test Conditions
Otherwise Unless Specified
V+ = 3 V, ± 10 %, V_IN = 0.5 or 1.5 V^e
Temp^a
Limits
- 40 to 85 °C
Min^b Typ^c Max^b
Unit
Analog Switch
Analog Signal Range^d
On-Resistance
r_ON Flatness
r_ON MatchFlat
Switch Off Leakage Current
V_NO, V_NC
V_COM
Full
0
V+
V
r_ON
V+ = 2.7 V, V_COM = 0.2 V/1.5 V
I_NO, I_NC = 100 mA
Room
Full
0.85 1.2
1.3
r_ON
Flatness
Δr_ON
V+ = 2.7 V, V_COM = 0 to V+, I_NO, I_NC = 100 mA
Room
Room
Ω
0.2
0.06
I_NO(off)
I_NC(off)
I_COM(off)
V+ = 3.3 V
V_NO, V_NC = 0.3 V/3 V, V_COM = 3 V/10.3 V
Room - 1
Full - 10
Room - 1
Full - 10
1
10
1
nA
10
Channel-On Leakage Current I_COM(on)
V+ = 3.3 V, V_NO, V_NC = V_COM = 0.3 V/3 V
Room - 1
Full - 10
1
10
Digital Control
Input High Voltage
Input Low Voltage
Input Capacitance^d
V_INH
V_INL
C_in
Full
1.5
Full
V
0.5
Full
3.3
pF
Input Current^f
I_INL or I_INH
V_IN = 0 or V+
Full
-1
1
µA
Dynamic Characteristics
Turn-On Time
Turn-Off Time
t_ON
Room
Full
t_OFF
V_NO or V_NC = 2.0 V, R_L = 300 Ω, C_L = 35 pF
Figures 1 and 2
Room
Full
28
51
55
ns
12
33
34
Break-Before-Make Time
t_d
Room
1
Charge Injection^d
Q_INJ
C_L = 1 nF, V_GEN = 0 V, R_GEN = 0 Ω, Figure 3 Room
9
pC
Off-Isolation^d
Crosstalk^d
OIRR
Room
- 64
X_TALK
R_L = 50 Ω, C_L = 5 pF, f = 1 MHz
Room
- 64
dB
NO, NC Off Capacitance^d
C_NO(off)
C_NC(off)
Room
30
V_IN = 0 or V+, f = 1 MHz
pF
Channel-On Capacitance^d
C_ON
Room
77
Power Supply
Power Supply Range
V+
1.5
3.6
V
Power Supply Current
I+
V+ = 3.6 V, V_IN = 0 or V+
0.01
1.0
µA
Notes:
a. Room = 25 °C, Full = as determined by the operating suffix.
b. The algebraic convention whereby the most negative value is a minimum and the most positive a maximum, is used in this data sheet.
c. Typical values are for design aid only, not guaranteed nor subject to production testing.
d. Guarantee by design, nor subjected to production test.
e. V_IN = input voltage to perform proper function.
f. Guaranteed by 3 V leakage testing, not production tested.
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation
of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum
rating conditions for extended periods may affect device reliability.
Document Number: 72308
S-70852-Rev. B, 30-Apr-07
www.vishay.com
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