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DG2707_11 Datasheet, PDF (3/9 Pages) Vishay Siliconix – High Speed, Low Voltage, 3ohm , Differential 4:1 CMOS Analog Multiplexer/Switch
DG2707
Vishay Siliconix
SPECIFICATIONS (V+ = 3.15 V)
Parameter
Symbol
Test Conditions
Otherwise Unless Specified
Limits
- 40 °C to 85 °C
Temp.b Min.d Typ.c Max.d Unit
Analog Switch
Analog Signal Rangee
Vanalog
On Resistance
RDS(on)
RON Match
RON Resistance Flatness
Channel-Off Leakage Current
R(on)
R(on) Flatness
ISX(off)
IDX(off)
Channel-On Leakage Current
IDX(on)
RDS(on)
V+ = 3.15 V, ISX = 10 mA, VDX = 1.0 V
V+ = 3.15 V, ISX = 10 mA, VDX = 1.0 V
V+ = 3.15 V, ISX = 10 mA, VDX = 0.0 V, 1.0 V
V+ = 3.6 V, VSX = 0.5 V/3 V, VDX = 3 V/0.5 V
V+ = 3.6 V, VSX, VDX = 3 V/0.5 V
Full
0
V+ V
Room
2.8 5.5
Full
Room
6

0.3
Room
0.6
Room - 5
5
Full - 10
Room - 10
10
nA
10
Full - 20
20
Digital Control
Input High Voltage
Input Low Voltage
Input Current
Input Capacitance
Dynamic Characteristics
VINH
VINL
IINL or IINH
CIN
VIN = 0 or V+
V+ = 3.15, f = 1 MHz
1.65
Full
V
0.4
-1
1 µA
5.1
pF
Break-Before-Make Time
tBBM
Room
1
Full
5
Enable Turn-On Time
Enable Turn-Off Time
tON(EN)
tOFF(EN)
VSX = 1.5 V, RL = 50 , CL = 35 pF
Room
Full
Room
Full
20 45
55
ns
15 35
45
Transition Time
Charge Injectiond
Off-Isolationd
Crosstalkd, f
Bandwidthd
Total Harmonic Distortiond
SX, DX Off Capacitanced
Channel-On Capacitanced
Power Supply
tTRANS
QINJ
OIRR
XTALK
BW
THD
CS(off)
CDX(off)
CDX(on)
CL = 1 nF, RGEN = 0 , VSX = 2 V
V+ = 3.15 V, f = 1 MHz, RL = 50 , CL = 5 pF
V+ = 3.15 V, RL = 50 , CL = 5 pF, - 3 dB
V+ = 3.15 V, Rload = 600 
V+ = 3.15 V, f = 1 MHz
Room
Full
Room
Room
Room
Room
Room
35 55
65
- 14
pC
- 70
dB
- 90
120
MHz
0.02
%
16
42
pF
49
Power Supply Range
V+
1.65
4.3 V
Power Supply Current
I+
VIN = 0 V or V+
Full
1
µA
Notes:
a. Room = 25 °C, Full = as determined by the operating suffix.
b. The algebraic convention whereby the most negative value is a minimum and the most positive a maximum, is used in this data sheet.
c. Typical values are for design aid only, not guaranteed nor subject to production testing.
d. Guarantee by design, not subjected to production test.
e. VIN = input voltage to perform proper function.
f. Crosstalk measured between channels.
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation
of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum
rating conditions for extended periods may affect device reliability.
Document Number: 68397
S11-0176-Rev. B, 07-Feb-11
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