DG2011_08 Datasheet, PDF (3/8 Pages) Vishay Siliconix – Low-Voltage, Low rON, Single SPDT Analog Switch In SC-89 Package

DG2011
Vishay Siliconix
SPECIFICATIONS (V+ = 3 V)
Parameter
Analog Switch
Symbol
Test Conditions
Otherwise Unless Specified
V+ = 3 V, ±10 %,V_IN = 0.4 V or 2.0 V^e
Temp^a
Limits
–40 to 85 °C
Min^b Typ^c Max^b
Unit
Analog Signal Range^d
On-Resistance
r_ON Match
r_ON Flatness
Switch Off Leakage Current
Channel-On Leakage Current^f
Digital Control
V_NO, V_NC,
V_COM
r_ON
Δr_ON
r_ON
Flatness
I_NO(off)
I_NC(off)
I_COM(off)
I_COM(on)
V+ = 2.7 V, V_COM = 0.9 V/1.5 V
I_NO, I_NC = 50 mA
V+ = 3.3 V,
V_NO, V_NC= 1 V/3 V, V_COM = 3 V/1 V
V+ = 3.3 V, V_NO, V_NC = V_COM = 1 V/3 V
Full
0
Room
1.8
Full
Room
Room
0.2
Room - 1
Full
- 10
Room - 1
Full
- 10
Room - 1
Full
- 10
V+
V
2.7
2.9
0.2
Ω
0.5
1
10
1
nA
10
1
10
Input High Voltage
Input Low Voltage
Input Capacitance
Input Current
Dynamic Characteristics
V_INH
V_INL
C_in
I_INL or I_INH
V_IN = 0 or V+
Full
1.6
Full
V
0.4
Full
4
pF
Full
1
1
µA
Turn-On Time
Turn-Off Time
Break-Before-Make Time
Charge Injection^d
Off-Isolation^d
Crosstalk^d
N_O, N_C Off Capacitance^d
Channel-On Capacitance^d
Power Supply
t_ON
Room
Full
t_OFF
V_NO or V_NC = 2.0 V, R_L = 300 Ω, C_L = 35 pF Room
Full
t_BBM
Room
1
Q_INJ
C_L = 1 nF, V_GEN = 0 V, R_GEN = 0 Ω
Room
OIRR
X_TALK
R_L = 50 Ω, C_L = 5 pF, f = 1 MHz
Room
Room
C_NO(off)
C_NC(off)
C_ON
V_IN = 0 or V+, f = 1 MHz
Room
Room
45
75
77
29
59
ns
62
16
2
pC
- 62
dB
- 68
28
pF
84
Power Supply Range
V+
1.8
5.5
V
Power Supply Current
I+
Power Consumption
P_C
V_IN = 0 or V+
0.01 1.0 µA
3.3 µW
Notes:
a. Room = 25 °C, Full = as determined by the operating suffix.
b. Typical values are for design aid only, not guaranteed nor subject to production testing.
c. The algebraic convention whereby the most negative value is a minimum and the most positive a maximum, is used in this data sheet.
d. Guarantee by design, nor subjected to production test.
e. V_IN = input voltage to perform proper function.
f. Guaranteed by 5 V leakage testing, not production tested.
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation
of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum
rating conditions for extended periods may affect device reliability.
Document Number: 70102
S-60004–Rev. F, 16-Jan-06
www.vishay.com
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