VOL617A Datasheet, PDF (2/8 Pages) Vishay Siliconix – Optocoupler, Phototransistor Output, Low Input Current, 4 Pin LSOP, Long Creepage Mini-Flat Package

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VOL617A
Vishay Semiconductors
ABSOLUTE MAXIMUM RATINGS (T_amb = 25 °C, unless otherwise specified)
PARAMETER
TEST CONDITION
SYMBOL
VALUE
UNIT
INPUT
Reverse voltage
Power dissipation
Forward current
Junction temperature
OUTPUT
V_R
6
V
P_diss
100
mW
I_F
60
mA
T_j
125
°C
Collector emitter voltage
Emitter collector voltage
Collector current
Power dissipation
Junction temperature
COUPLER
V_CEO
80
V
V_ECO
7
V
I_C
50
mA
t_p/T = 0.5, t_p < 10 ms
I_C
100
mA
P_diss
150
mW
T_j
125
°C
Isolation test voltage between emitter and detector
Total power dissipation
Storage temperature range
Ambient temperature range
Soldering temperature ⁽¹⁾
t = 1 min
 10 s
V_ISO
P_tot
T_stg
T_amb
T_sld
5000
250
- 55 to + 125
- 55 to + 110
260
V_RMS
mW
°C
°C
°C
Notes
• Stresses in excess of the absolute maximum ratings can cause permanent damage to the device. Functional operation of the device is not
implied at these or any other conditions in excess of those given in the operational sections of this document. Exposure to absolute
maximum ratings for extended periods of the time can adversely affect reliability.
(1) _{Refer to reflow profile for soldering conditions for surface mounted devices.}
300
Coupled device
250
200
Phototransistor
150
100
IR-diode
50
0
0 20 40 60 80 100 120
T_amb - Ambient Temperature (°C)
Fig. 1 - Total Power Dissipation vs. Ambient Temperature
ELECTRICAL CHARACTERISTICS (T_amb = 25 °C, unless otherwise specified)
PARAMETER
TEST CONDITION
SYMBOL
MIN.
TYP.
MAX.
UNIT
INPUT
Forward voltage
Capacitance
Reverse current
OUTPUT
I_F = 5 mA
V_F
V_R = 0 V, f = 1 MHz
C_O
V_R = 6 V
I_R
1.16
1.5
V
45
pF
100
μA
Collector emitter leakage current
V_CE = 10 V, I_F = 0 A
I_CEO
Collector emitter capacitance
V_CE = 5 V, f = 1 MHz
C_CE
COUPLER
10
200
nA
7
pF
Collector emitter saturation
voltage
I_C = 1.0 mA, I_F = 5 mA
V_CEsat
0.25
0.4
V
Coupling capacitance
f = 1 MHz
C_C
0.25
pF
Note
• Minimum and maximum values are testing requirements. Typical values are characteristics of the device and are the result of engineering
evaluation. Typical values are for information only and are not part of the testing requirements.
Rev. 1.6, 30-Jan-13
2
Document Number: 82424
For technical questions, contact: [e-mail]
THIS DOCUMENT IS SUBJECT TO CHANGE WITHOUT NOTICE. THE PRODUCTS DESCRIBED HEREIN AND THIS DOCUMENT
ARE SUBJECT TO SPECIFIC DISCLAIMERS, SET FORTH AT www.vishay.com/doc?91000