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SQM90P06-07L_15 Datasheet, PDF (2/9 Pages) Vishay Siliconix – Automotive P-Channel 60 V (D-S) 175 °C MOSFET
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SQP90P06-07L
Vishay Siliconix
SPECIFICATIONS (TC = 25 °C, unless otherwise noted)
PARAMETER
SYMBOL
TEST CONDITIONS
Static
Drain-Source Breakdown Voltage
VDS
VGS = 0, ID = -250 μA
Gate-Source Threshold Voltage
Gate-Source Leakage
VGS(th)
IGSS
VDS = VGS, ID = -250 μA
VDS = 0 V, VGS = ± 20 V
VGS = 0 V
VDS = -60 V
Zero Gate Voltage Drain Current
IDSS
VGS = 0 V VDS = -60 V, TJ = 125 °C
On-State Drain Current a
ID(on)
VGS = 0 V
VGS = -10 V
VDS = -60 V, TJ = 175 °C
VDS ≤ -5 V
VGS = -10 V
ID = -30 A
Drain-Source On-State Resistance a
RDS(on)
VGS = -10 V
VGS = -10 V
VGS = -4.5 V
ID = -30 A, TJ = 125 °C
ID = -30 A, TJ = 175 °C
ID = -20 A
Forward Transconductance b
gfs
VDS = -15 V, ID = -30 A
Dynamic b
Input Capacitance
Output Capacitance
Reverse Transfer Capacitance
Ciss
Coss
Crss
VGS = 0 V
VDS = -25 V, f = 1 MHz
Total Gate Charge c
Qg
Gate-Source Charge c
Qgs
VGS = -10 V VDS = -30 V, ID = -110 A
Gate-Drain Charge c
Qgd
Gate Resistance
Rg
f = 1 MHz
Turn-On Delay Time c
td(on)
Rise Time c
Turn-Off Delay Time c
tr
td(off)
VDD = -30 V, RL = 0.27 Ω
ID ≅ -110 A, VGEN = -10 V, Rg = 1 Ω
Fall Time c
tf
Source-Drain Diode Ratings and Characteristics b
Pulsed Current a
ISM
Forward Voltage
VSD
IF = -100 A, VGS = 0
Notes
a. Pulse test; pulse width ≤ 300 μs, duty cycle ≤ 2 %.
b. Guaranteed by design, not subject to production testing.
c. Independent of operating temperature.
MIN. TYP. MAX. UNIT
-60
-
-
V
-1.5 -2.0 -2.5
-
-
± 100 nA
-
-
-1
-
-
-50
μA
-
-
-250
-120
-
-
A
- 0.0056 0.0067
-
- 0.0110
Ω
-
- 0.0130
- 0.0070 0.0088
-
90
-
S
- 11 423 14 280
-
1034 1295 pF
-
809 1015
-
180 270
-
31
-
nC
-
43
-
1.1 2.27 3.5
Ω
-
15
23
-
23
35
ns
-
97
146
-
32
48
-
-
-480
A
-
-0.95 -1.5
V
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation
of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum
rating conditions for extended periods may affect device reliability.
S14-0585-Rev. A, 17-Mar-14
2
Document Number: 62665
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