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H11C4 Datasheet, PDF (2/5 Pages) Vishay Siliconix – Optocoupler, PhotoSCR Output, 400 V VRM, 5 A surge current
H11C4/ H11C5/ H11C6
Vishay Semiconductors
Output
Parameter
Reverse gate voltage
Anode voltage
RMS forward current
Surge anode current
Peak forward current
Surge gate current
Power dissipation
Derate linearly from 25°C
Test condition
DC or AC peak
10 ms duration
100 µs, 1% Duty Cycle
5.0 ms duration
Coupler
Parameter
Isolation test voltage (between
emitter and detector referred to
standard climate 23 °C/ 50 %
RH, DIN 50014)
Creepage
Clearance
Comparative tracking index per
DIN IEC 112/VDE 0303, part 1
Isolation resistance
Total package dissipation
Test condition
VIO = 500 V, Tamb = 25 °C
VIO = 500 V, Tamb = 100 °C
Derate linearly from 25 °C
Operating temperature range
Storage temperature range
Lead soldering time at 260 °C
Symbol
VRG
VA
IFRMS
IAS
IFM
IGS
Pdiss
Symbol
VISO
RIO
RIO
Ptot
Tamb
Tstg
Value
6.0
400
300
5.0
10
200
1000
13.3
Value
5300
≥ 7.0
≥ 7.0
175
≥ 1012
≥ 1011
400
5.5
- 55 to + 100
- 55 to + 150
10
Unit
V
V
mA
A
A
mA
mW
mW/°C
Unit
VRMS
mm
mm
Ω
Ω
mW
mW/°C
°C
°C
sec.
Electrical Characteristics
Tamb = 25 °C, unless otherwise specified
Minimum and maximum values are testing requirements. Typical values are characteristics of the device and are the result of engineering
evaluation. Typical values are for information only and are not part of the testing requirements.
Input
Parameter
Forward voltage
Reverse current
Capacitance
Test condition
IF = 10 mA
VR = 3.0 V
VR = 0, f = 1.0 MHz
Symbol
Min
Typ.
Max
Unit
VF
1.2
1.5
V
IR
10
µA
CO
50
pF
Output
Parameter
Test condition
Symbol
Min
Typ.
Max
Unit
Forward blocking voltage
RGK = 10 KΩ, TA = 100 °C,
VDM
400
V
Id = 150 µA
Reverse blocking voltage
RGK = 10 KΩ, TA = 100 °C,
VDM
400
V
Id = 150 µA
On-state voltage
IT = 300 mA
Vt
1.1
1.3
V
Holding current
RGK = 27 KΩ, VFX = 50 V
IH
500
µA
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Document Number 83610
Rev. 1.6, 26-Oct-04