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SI4701BDY Datasheet, PDF (1/5 Pages) Vishay Siliconix – Load Switch with Level-Shift
New Product
Si4701BDY
Vishay Siliconix
Load Switch with Level-Shift
PRODUCT SUMMARY
VDS2 (V)
30
rDS(on) (W)
0.015 @ VGS2 = 10 V
0.021 @ VGS2 = 4.5 V
ID (A)
7.0
6.0
S1 1
VON/OFF 2
S2 3
S2 4
SO-8
Top View
8 VHV
7 VIN
6 VIN
5 VIN
Ordering Information: Si4701BDY—E3
Si4701BDY-T1—E3 (with Tape and Reel)
Product Is Completely Pb-free
5, 6, 7
VIN
Q2
8
VHV
3, 4 S2
2
VON/OFF
Q1
1
S1
ABSOLUTE MAXIMUM RATINGS (TA = 25_C UNLESS OTHERWISE NOTED)
Parameter
Symbol
Limit
Input Voltage
Q2 Gate-Drive Voltage Referenced to S1 or S2
ON/OFF Voltage
Load Current
Continuous Intrinsic Diode Conductiona
Maximum Power Dissipationa
Operating Junction and Storage Temperature Range
ESD Rating, MIL-STD-883D Human Body Model (100 pF, 1500 W)
Continuousa
Pulsed b
VIN
VHV
VON/OFF
IL
IS
PD
TJ, Tstg
ESD
30
20
8
7.0
"30
−1.15
1.25
−55 to 150
3
Unit
V
A
W
_C
kV
THERMAL RESISTANCE RATINGS
Parameter
Maximum Junction-to-Ambient (t = steady state)a
Maximum Junction-to-Foot (Q2)
Symbol
RthJA
RthJC
Typical
80
25
Maximum
100
30
Unit
_C/W
SPECIFICATIONS (TJ = 25_C UNLESS OTHERWISE NOTED)
Parameter
Symbol
Test Condition
Min
Typ
Max Unit
OFF Characteristics
Reverse Leakage Current
IFL
Diode Forward Voltage
VSD
ON Characteristics
VIN = 30 V, VON/OFF = 0 V, VHV = 0 V
IS = −1.15 A
1
mA
0.7
1
V
On-Resistance (Q2)
On-State (Q2) Drain-Current
rDS(on)
VON/OFF = 0 V, ID = 7 A, VHV = 10 V, VS2 = 0 V
VON/OFF = 0 V, ID = 6 A, VHV = 4.5 V, VS2 = 0 V
0.012
0.015
W
0.017
0.021
ID(on)
VIN-OUT v 0.1 V, VIN = 5 V, VON/OFF = 0 V, VHV = 10 V
20
A
Notes
a. Surface Mounted on FR4 Board.
b. Pulse test: pulse width v300 ms, duty cycle v2%.
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation
of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum rating
conditions for extended periods may affect device reliability.
Document Number: 73250
S-50343—Rev. A, 28-Feb-05
www.vishay.com
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