VS3125 Datasheet, PDF (3/6 Pages) Vaishali Semiconductor – Quad Bus Switch with Individual Active Low Enables

VS3125
Table 6. Electrical Characteristics Over Recommended Operating Free-air Temperature Range
Symbol Parameter
VIK
Clamp Voltage
Test Conditions
Control Inputs VCC = Min., IIK = -18mA
Min Typ⁽¹⁾ Max
-1.5
Switch I/O
-1.5
VOH
Logic High Voltage Switch I/O
VIN = VCC = 5V, IOUT = -5µA
3.7 3.9
4.1
VCC= 4.3V,VIN = 5V
VCC= 4.3V,VIN = 5V,
3.0 3.3
3.6
IOUT = -100µA
|II|
Input Leakage
Control Inputs VCC = Max., VI = VCC or GND
1
Current
|OFF|
Power OFF Leakage Control Inputs VCC = 0, VI or VO = VCC or GND.
1
Current
Switch I/O
|IOZ|
OFF State Leakage Switch I/O
VCC = Max., VI/O = VCC,
1
Current
/xOE= VCC
IODL
Switch I/O Drive
VCC = Min, VIN = 0, VOUT = 0.4V
50
Current (Logic LOW)
IODH
Switch I/O Drive
VCC = Min, VIN = VCC, VOUT = 2.4V
-50
Current (Logic HIGH)
Units
V
V
µA
µA
µA
mA
mA
RON
Switch ON
Resistance⁽²⁾
VCC = 3.0V, VIN = 0, IOUT = 15mA
5⁽²⁾
7Ω
Notes:
1. Typical value is specified at VCC = 5V and TA = 25^oC.
2. RON is measured by forcing specified current into the ‘output’ node of the switch with the ‘input’ node of the switch
at the specified voltage.
Table 7. Power Supply Characteristics Over Recommended Operating Free-air Temperature Range
Symbol Parameter
Test Conditions ⁽¹⁾
Max Units
ICCQ
Quiescent Power Supply Current
VCC = Max.,/xOE = VCC or GND, f = 0
1
µA
∆ICC
Power Supply Current per Input
High ⁽²⁾
VCC = Max, VIN = 3.4V, f = 0
1.5
mA
QCCD
Dynamic Power Supply Current ⁽³⁾
VCC = Max, Switch pins open, Control Inputs
toggling at 50% duty cycle
0.25
mA/MHz
Notes:
1. For conditions shown as Min or Max, use the appropriate values specified under Recommended Operating
Conditions.
2. Per control input. All other control inputs at GND. Switch I/O pins do not contribute to ∆ICC.
3. This parameter represents the average dc current resulting from the switching of internal nodes of the device at a
given frequency. The switch I/O pins make insignificant contribution to the dynamic power supply current of the
device. This parameter is guaranteed, but not production tested.
2001-04-12
Page 3
MDSS-0011-01
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