CHR3693-QDG Datasheet, PDF (3/14 Pages) United Monolithic Semiconductors – 21-26.5GHz Down converter

21-26.5GHz Integrated Down converter CHR3693-QDG
Device thermal performances
All the figures given in this section are obtained assuming that the QFN device is cooled
down only by conduction through the package thermal pad (no convection mode considered).
The temperature is monitored at the package back-side interface (Tcase) as shown below.
The system maximum temperature must be adjusted in order to guarantee that Tcase
remains below than the maximum value specified in the next table. So, the system PCB must
be designed to comply with this requirement.
A derating must be applied on the dissipated power if the Tcase temperature can not be
maintained below than the maximum temperature specified (see the curve Pdiss. Max) in
order to guarantee the nominal device life time (MTTF).
DEVICE THERMAL SPECIFICATION : Product name
Recommended max. junction temperature (Tj max)
:
124 °C
Junction temperature absolute maximum rating
:
175 °C
Max. continuous dissipated power (Pdiss. Max.)
: 0.64 W
=> Pdiss. Max. derating above Tcase⁽¹⁾= 85 °C :
16 mW/°C
Junction-Case thermal resistance (Rth J-C)⁽²⁾
:
<60 °C/W
Minimum Tcase operating temperature⁽³⁾
:
-40 °C
Maximum Tcase operating temperature⁽³⁾
:
85 °C
Minimum storage temperature
:
-55 °C
Maximum storage temperature
:
150 °C
(1) Derating at junctio n temperature co nstant = Tj max.
(2) Rth J-C is calculated fo r a wo rst case co nsidering the ho t t e s t junc t io n o f the M M IC and all the devices biased.
(3) Tcase=P ackage back side temperature measured under the die-attach-pad (see the drawing belo w).
0.7
Tcase
0.6
0.5
0.4
0.3
0.2
Pdiss. Max. @Tj <Tj max (W)
0.1
0
-50 -25
0
25 50 75 100 125 150
Tcase (°C)
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6.4
Ref. : DSCHR3693QDG2181 - 29 Jun 12
3/14
Specifications subject to change without notice
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