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SSM3K04FU Datasheet, PDF (2/2 Pages) Toshiba Semiconductor – High Speed Switch Applications
SMD Type
Electrical Characteristics (Ta = 25°C)
Product specification
SSM3K04FU
Characteristics
Gate leakage current
Drain-source breakdown voltage
Drain cut-off current
Gate threshold voltage
Forward transfer admittance
Drain-source ON resistance
Input capacitance
Reverse transfer capacitance
Output capacitance
Switching time
Turn-on time
Turn-off time
Gate-source resistor
Symbol
Test Condition
Min Typ. Max Unit
IGSS
VGS = 10 V, VDS = 0
⎯
⎯
15
μA
V (BR) DSS ID = 100 μA, VGS = 0
20
⎯
⎯
V
IDSS
VDS = 20 V, VGS = 0
⎯
⎯
1
μA
Vth
VDS = 3 V, ID = 0.1 mA
0.7
⎯
1.3
V
⎪Yfs⎪
VDS = 3 V, ID = 10 mA
25
50
⎯
mS
RDS (ON) ID = 10 mA, VGS = 2.5 V
⎯
4
12
Ω
Ciss
VDS = 3 V, VGS = 0, f = 1 MHz
⎯ 11.0 ⎯
pF
Crss
VDS = 3 V, VGS = 0, f = 1 MHz
⎯
3.3
⎯
pF
Coss
VDS = 3 V, VGS = 0, f = 1 MHz
⎯
9.3
⎯
pF
ton
VDD = 3 V, ID = 10 mA, VGS = 0~2.5 V
⎯
0.16
⎯
μs
toff
VDD = 3 V, ID = 10 mA, VGS = 0~2.5 V
⎯
0.19
⎯
RGS
VGS = 0~10 V
0.7 1.0 1.3 MΩ
Switching Time Test Circuit
(a) Test circuit
(b) VIN
VGS
(c) VOUT
VDS
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