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TSH481 Datasheet, PDF (1/7 Pages) Taiwan Semiconductor Company, Ltd – Ratio-metric Linear Hall Effect Switch
TO-92S
Pin Definition:
1. VCC
2. GND
3. Output
TSH481
Ratio-metric Linear Hall Effect Switch
Description
TSH481 is a linear Hall-effect sensor which is composed of Hall sensor, linear amplifier and Totem-Pole output
stage. It features low noise output, which makes it unnecessary to use external filtering. It also can provide
increased temperature stability and accuracy. The linear Hall sensor has a wide operating temperature range of -
40 oC to +105 oC, appropriate for commercial, consumer, and industrial environments.
The high sensitivity of Hall-effect sensor accurately tracks extremely weak changes in magnetic flux density. The
linear sourcing output voltage is set by the supply voltage and in proportion of variation of the magnetic flux
density. Typical operation current is 2.5mA and operating voltage range is 3.0V to 6.5V
Features
Ordering Information
● Operating Voltage Range: 3.0V~6.5V
● Low-Noise Operation
● Linear output for circuit design flexibility
● Totem-Pole for a stable and accurate output
● Responds to either positive or negative magnetic
flux density
● Robust ESD performance
Part No.
Package
Packing
TSH481CT B0G
TO-92S 1kpcs / Bulk Bag
Note: “G” denote for Halogen Free Product
Application
● Current sensing
● Motor control
● Position sensing
● Magnetic code reading
● Rotary encoder
● Ferrous metal detector
● Vibration sensing
● Liquid level sensing
● Weight sensing
Absolute Maximum Ratings (TA = 25oC unless otherwise noted)
Characteristics
Limit
Value
Unit
Supply voltage
VCC
8
V
Reverse voltage
VCC
-0.5
V
Magnetic flux density
Unlimited
G
Output current
Operating Temperature Range
IOUT
TOPR
10
mA
-40 to +85
oC
Storage temperature range
Maximum Junction Temp
Thermal Resistance - Junction to Ambient
Thermal Resistance - Junction to Case
TSTG
TJ
RθJA
RθJC
-65 to +150
150
206
148
oC
oC
oC/W
oC/W
Package Power Dissipation
PD
606
mW
Note: Exceeding the absolute maximum ratings may cause permanent damage. Exposure to absolute maximum-
rated conditions for extended periods may affect device reliability.
1/7
Version: A14