TSH282 Datasheet, PDF (1/8 Pages) Taiwan Semiconductor Company, Ltd – Sensitivity Unipolar Hall Effect Switch

TSH282
Sensitivity Unipolar Hall Effect Switch
TO-92S
Pin Definition:
1. VCC
2. GND
3. Output
SOT-23
Pin Definition:
1. VCC
2. Output
3. GND
Description
TSH282 is an unipolar Hall effect sensor IC. It incorporates advanced chopper stabilization technology to provide
accurate and stable magnetic switch points. The design, specifications and performance have been optimized for
applications of solid state switches. The output transistor will be switched on (B_OP) in the presence of a sufficiently
strong South pole magnetic field facing the marked side of the package. Similarly, the output will be switched off
(B_RP) in the presence of a weaker South field and remain off with “0” field.
Features
Ordering Information
● CMOS Hall IC Technology
● Solid-State Reliability
● Chopper stabilized amplifier stage
● Unipolar, output switches with absolute value of
South pole from magnet
● Operation down to 3.0V
● High Sensitivity for direct reed switch replacement
applications
Part No.
Package
Packing
TSH282CT B0G
TO-92S 1Kpcs / Bulk Bag
TSH282CX RFG
SOT-23
3Kpcs / 7” Reel
Note: “G” denote for Halogen Free Product
Application
● Solid state switch
● Limit switch, Current limit
● Interrupter
● Current sensing
● Magnet proximity sensor for reed switch
replacement
Absolute Maximum Rating (Ta = 25^oC unless otherwise noted)
Characteristics
Limit
Value
Unit
Supply voltage
Output Voltage
Reverse voltage
Magnetic flux density
V_CC
V_OUT
V_CC/OUT
27
27
-0.3
Unlimited
V
V
V
Gauss
Output current
Operating Temperature Range
Storage temperature range
Maximum Junction Temp
Thermal Resistance - Junction to Ambient
TO-92S
SOT-23
I_OUT
T_OPR
T_STG
T_J
θ_JA
50
-40 to +85
-55 to +150
150
206
543
mA
o_C
o_C
o_C
o_C/W
Thermal Resistance - Junction to Case
TO-92S
SOT-23
θ_JC
148
o_C/W
410
Package Power Dissipation
TO-92S
SOT-23
P_D
606
230
mW
Note: Exceeding the absolute maximum ratings may cause permanent damage. Exposure to absolute maximum-
rated conditions for extended periods may affect device reliability.
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Version: B13