TSH248 Datasheet, PDF (1/8 Pages) Taiwan Semiconductor Company, Ltd – Micropower Omni-Polar Hall Effect Switch

TSH248
Micropower Omni-Polar Hall Effect Switch
TSOT-23
Pin Definition:
1. VCC
2. Output
3. GND
Description
TSH248 Hall-effect sensor is a temperature stable, stress-resistant, micro-power switch. Superior high-
temperature performance is made possible through a dynamic offset cancellation that utilizes chopper-
stabilization. This method reduces the offset voltage normally caused by device over-molding, temperature
dependencies and thermal stress.
TSH248 includes the following on a single silicon chip: voltage regulator, Hall voltage generator, small-signal
amplifier, chopper stabilization, Schmitt trigger, open-drain output. Advanced CMOS wafer fabrication processing
is used to take advantage of low-voltage requirements, component matching, very low input-offset errors and
small component geometries.
Features
Ordering Information
● CMOS Hall IC Technology
● Solid-State Reliability
● Low power consumption for battery applications
● Operation voltage range from 2.5V~3.5V
Part No.
Package
Packing
TSH248CX RFG TSOT-23 3kpcs / 7” Reel
Note: “G” denote for Halogen Free Product
Application
● Solid state switch
● Lid close sensor for power supply devices
● Magnet proximity sensor for reed switch
replacement in high duty cycle applications.
● Handheld Wireless Handset Awake Switch (Flip
Cell/PHS Phone/Note Book/Flip Video Set)
Absolute Maximum Ratings (T_A = 25^oC unless otherwise noted)
Characteristics
Limit
Supply voltage
Output Voltage
Reverse voltage
Magnetic flux density
V_CC
V_OUT
V_CC/OUT
Value
5
5
-0.3
Unlimited
Unit
V
V
V
G
Output current
I_OUT
2
mA
Operating Temperature Range
Storage temperature range
Maximum Junction Temp
Thermal Resistance - Junction to Ambient
Thermal Resistance - Junction to Case
T_OPR
T_STG
T_J
Rθ_JA
Rθ_JC
-40 to +85
-55 to +150
150
543
410
o_C
o_C
o_C
o_C/W
o_C/W
Package Power Dissipation
P_D
230
mW
Note: Exceeding the absolute maximum ratings may cause permanent damage. Exposure to absolute maximum-
rated conditions for extended periods may affect device reliability.
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Version: B14