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GA1087 Datasheet, PDF (4/10 Pages) TriQuint Semiconductor – 11-Output Configurable Clock Buffer
GA1087
Absolute Maximum Ratings 1
Storage temperature
Ambient temperature with power applied 2
Supply voltage to ground potential
DC input voltage
DC input current
Package thermal resistance (MQuad)
Die junction temperature
–65 °C to +150 °C
–55 °C to +100 °C
–0.5 V to +7.0 V
–0.5 V to (VDD + 0.5) V
–30 mA to +5 mA
θJA = 45 °C/W
TJ = 150 °C␣ ␣ ␣ ␣
DC Characteristics (VDD = +5 V + 5%, TA = 0 °C to +70 °C) 3
Symbol
VOHT
VOHC
VOL
VIH 5
VIL5
IIL
IIH
II
IDDS 6
VI
Description
Output HIGH voltage
Output HIGH voltage
VIN
Output LOW voltage
VIN
Input HIGH level
Voltage for all Inputs
Input LOW level
Voltage for all inputs
Input LOW current
Input HIGH current
Input HIGH current
Power supply current
Input clamp voltage
Test Conditions
Min
VDD= Min
IOH = –30 mA
2.4
VIN= VIH or VIL
VDD = Min
IOH = –1 mA
3.2
= VIH or VIL
VDD = Min
= VIH or VIL
IOL = 30 mA
Guaranteed input logical HIGH
2.0
Guaranteed input logical LOW
VDD = Max
VDD = Max
VDD = Max
VDD = Max
VDD = Min
VIN = 0.40 V
VIN = 2.7 V
VIN = 5.5 V
IIN = –18 mA
Limits 4
Typ
Max
3.4
4.1
0.27
0.5
–156
0
2
119
–0.70
0.8
–400
25
1000
160
–1.2
Units
V
V
V
V
V
µA
µA
µA
mA
V
Capacitance
Symbol
CIN 3,7
Description
Input capacitance
Test Conditions
VIN = 2.0 V at f = 1 MHz
Min
Typ
Max
Units
6
pF
Notes:
1. Exceeding these parameters may damage the device.
2. Maximum ambient temperature with device not switching and unloaded.
3. These values apply to both GA1087-MC500 and GA1087-MC700.
4. Typical limits are at VDD = 5.0 V and TA = 25 °C.
5. These are absolute values with respect to device ground and all overshoots due to system or tester noise are included.
6. This parameter is measured with device not switching and unloaded.
7. These parameters are not 100% tested, but are periodically sampled.
4
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