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TQ2060 Datasheet, PDF (3/6 Pages) TriQuint Semiconductor – High-Frequency Clock Generator
TQ2060
Table 2. Absolute Maximum Ratings
Storage Temperature
Ambient temperature with power applied
Supply voltage to ground potential
DC input voltage
DC input current
Package thermal resistance (MQuad)
Die junction temperature
–65°C to +150°C
–55°C to +110°C
–0.5 V to +7.0 V
–0.5 V to (VDD + 0.5) V
–30 mA to +5 mA
θJA = 45°C/W
TJ = 150°C
Note: Stresses above those listed in Absolute Maximum Ratings may cause permanent damage to the device.
The device should be operated only under the DC and AC conditions shown below.
Table 3. DC Characteristics (VDD = +5 V + 5%, TA = 0 °C to +70 °C) 1
Symbol
VOH
VOL
VCMO
∆ VOUT
VIH2
VIL2
IIL
IIH
II
IDDS3
Description
Output HIGH voltage
Output LOW voltage
Output common mode voltage
Output differential voltage
Input HIGH level
Input LOW level
Input LOW current
Input HIGH current
Input HIGH current
Power supply current
Test Conditions
Min
VCC = Min PECL load
VCC–1.20
VCC = Min PECL load
VCC–2.00
PECL
VCC–1.60
PECL
0.6
Guaranteed input logical 2.0
HIGH Voltage for all inputs
Guaranteed input logical
LOW Voltage for all inputs
VDD = Max VIN = 0.40 V
VDD = Max VIN = 2.7 V
VDD = Max VIN = 5.3 V
VDD = Max
Typ
Max
Unit
VCC–0.50
V
VCC–1.60
V
VCC–1.20
V
1.2
V
V
0.8
V
–150
–400
µA
0
25
µA
2
1000
µA
85
120
mA
VI
Input clamp voltage
VDD = Min IIN = –18 mA
–0.70
–1.2
V
Table 4. Capacitance
Symbol
CIN
COUT
Description
Input Capacitance
Output Capacitance
Test Conditions
Min
VIN = 2.0 V at f = 1 MHz
VOUT = 2.0 V at f = 1 MHz
Typ
Max
Unit
6
pF
9
pF
Notes: 1. Typical limits are at VDD = 5.0 V and TA = 25˚C.
2. These are absolute values with respect to device ground and include all overshoots due to system or tester noise.
3. This parameter is measured with device not switching and unloaded.
For additional information and latest specifications, see our website: www.triquint.com
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