TB2924FG Datasheet, PDF (8/16 Pages) Toshiba Semiconductor – Class D, 20 W × 2-channel (BTL) Low-Frequency Power Amplifier IC

Test Circuit Diagram 1
TB2924FG
* LPF
Test
point
330 µF
C7
1 µF
C8
LPF *
OUT2
(+)
Out C
C1
R_L 8 Ω
Out C
C2
OUT2
(−)
GND
2200 µF
IN2
1 µF
C14
330 µF
C13
V_CC
560 pF R1
R2 560 pF
C3 150
0.1 µF
150 C4
C5
36 35 34 33 32 31 30 29 28
NC BOOT OUT PW OUT NC NC BOOT PW
2 (+) 2 (+) GND2 2 (−)
2 (−) V_CC2
Heat sink
27 26 25 24 23 22 21 20 19
Pre OSC IN2 FEED FEED OSC OSC Pre NC
GND2 SW
2 (−) 2 (+) OUT IN V_CC
BOOT OUT
PW OUT1
BOOT PW
V_REG 1 (+) 1 (+) NC GND1 (−) NC 1 (−) V_CC1
123456789
C16
C21
0.1 µF _{560 pF R3 R4 560 pF} 0.1 µF
C17 150 150 C18
Out C
C19
Out C
C20
OUT1
(+)
* LPF
R_L 8 Ω OUT1
(−)
1 µF
C22
330 µF
C23
LPF *
Heat sink
Pre
GND1 Rip/F NC
10 11 12
FEED FEED
IN1 1 (−) 1 (+) STBY MUTEV_CC/2
13 14 15 16 17 18
C24
4.7 µF
IN1
Test
point
*: Output L (4 Ω): 10 µH (A7502BY-180M: TOKO, INC.)
*: Output C (4 Ω): 1.0 µF
*: Output L (8 Ω): 18 µH (A7502BY-180M: TOKO, INC.)
*: Output C (8 Ω): 0.47 µF
*: Components in the test circuits are only used to obtain and confirm the device characteristics. These components
and circuits do not warrant to prevent the application equipment from malfunction or failure.
*: In addition to the low-pass filters (chebyshev LPFs) shown above, a fourth low-pass filter with a cut-off frequency
of 30 kHz is used for device characterization.
8
2006-01-25