TLP708 Datasheet, PDF (5/13 Pages) Toshiba Semiconductor – Factory Automation (FA) Home Electrical Appliances Operates at high ambient temperatures up to 125

TEST CIRCUIT 5: tpHL, tpLH Test Circuit
IF=7.5mA(P.G.)
(f=5MHz , duty=50%, tr=tf=4.5ns)
1
P.G.
2
IF monitor
6
5 ^{0.1μF RL=350Ω}
VO
*CL=15pF
3
4
SHIELD
*CL=15pF
RIN=100Ω
IF
VO
VCC
1.5 V
VOL
TLP708,TLP708F
tpHL
tf
50%
tpLH
90%
10%
tr
C includes probe and stray capacitance.
L
P.G.: Pulse generator
TEST CIRCUIT 6: Common-Mode Transient Immunity Test Circuit
SW
IF
→
1
A
B
2
3
＋ _VCM －
6
RL=350Ω ^VCM
0.1 μF
5
VO
4
VCC
・SW B : IF=0 mA
VO
・SW A : IF=10 mA
tr
2V
1000 V
90%
10%
tf
CMH
0.8 V
CML
CM _H
=
800(V )
t _r ^(μs)
CM
L
=
−
800(V )
t _f ^(μs)
5
2012-08-07