TCD2558D Datasheet, PDF (5/15 Pages) Toshiba Semiconductor – TOSHIBA CCD Linear Image Sensor CCD (charge coupled device)

TCD2558D
Note 10: Random noise is defined as the standard deviation (sigma) of the output level difference between two
adjacent effective pixels under no illumination (i.e. dark conditions) calculated by the following procedure.
1) Two adjacent pixels (pixel n and n + 1) in one reading are fixed as measurement points.
2) Each of the output level at video output periods averaged over 200 ns period to get V (n) and V (n +
1).
3) V (n + 1) is subtracted from V (n) to get DV.
DV = V (n) - V (n + 1)
4) The standard deviation of DV is calculated after procedure 2) and 3) are repeated 30 times (30
readings).
DV =
1
30
Ã¥
| DVi |
30 _{i = 1}
s=
1
30
Ã¥
(|
DVi
|
-
DV
)²
30 _{i = 1}
5) Procedure 2), 3) and 4) are repeated 10 times to get sigma value.
6) 10 sigma values are averaged.
s=
1
10
Ã¥
sj
10 _{j = 1}
7) I value calculated using the above procedure is observed 2 times larger than that measured
relative to the ground level. So we specify random noise as follows.
NDs = ¹ s
2
Operating Condition
Characteristics
Symbol
Min Typ. Max Unit
Clock pulse voltage
Shift pulse voltage
Reset pulse voltage
Clamp pulse voltage
Power supply voltage
“H” level
“L” level
“H” level
“L” level
“H” level
“L” level
“H” level
“L” level
4.5 5.0 5.5
VfA
V
0.0
¾
0.5
V_SH
VfA
“H”
- 0.5
VfA
“H”
VfA
“H”
V
0.0
¾
0.5
4.5 5.0 5.5
V_RS
V
0.0
¾
0.5
4.5 5.0 5.5
V_CP
V
0.0
¾
0.5
V_OD
11.4 12.0 13.0 V
Note 11: VfA “H” means the high level voltage of VfA when SH pulse is high level.
Note
(Note 11)
5
2002-12-25