TLP3113 Datasheet, PDF (4/6 Pages) Toshiba Semiconductor – MEASUREMENT INSTRUMENTS LOGIC IC TESTERS MEMORY TESTERS BOARD TESTERS SCANNERS

I F ─ Ta
100
80
60
40
20
0-20
0
20
40
60
80 100 120
Ambient temperature Ta (°C)
100
50 ^{Ta = 25 °C}
30
I F ─ VF
10
5
3
1
0.5
0.3
0.1
0.6
0.8
1
1.2
1.4
1.6
1.8
Forward voltage VF (V)
50
I ON = 80 mA
40 ^{I F = 5 mA}
t < 1s
30
RON ─ Ta
20
10
0-20
0
20
40
60
80
100
Ambient temperature Ta (°C)
TLP3113
I ON ─ Ta
160
120
80
40
0-20
0
20
40
60
80 100 120
Ambient temperature Ta (°C)
150
Ta = 25 °C
100 I F = 5 mA
I ON ─ VON
50
0
-50
-100
-150-3
-2
-1
0
1
2
3
On-sate voltage VON (V)
5
I ON = 80 mA
t < 1s
4
I FT ─ Ta
3
2
1
0-20
0
20
40
60
80
100
Ambient temperature Ta (°C)
4
2003-7-7