TLP2098 Datasheet, PDF (4/11 Pages) Toshiba Semiconductor – PHOTOCOUPLER GaAℓAs IRED & PHOTO-IC

TLP2098
Switching Characteristics
(Unless otherwise specified, Ta = -40 to 100°C,VCC = 3.0 to 20 V)
CHARACTERISTIC
TEST
SYMBOL _CIRCUIT
CONDITION
MIN TYP.
Propagation Delay Time
to Logic High output
tpLH
IF = 5→0mA
30
150
Propagation Delay Time
to Logic Low output
tpHL
IF = 0→5mA
7, 8
30
150
Switching Time Dispersion
|tpHL- (Note5)
―
between ON and OFF
tpLH|
―
―
Rise Time (10 – 90 %)
tr
IF = 5→0 mA , VCC = 5 V
―
30
Fall Time (90 – 10 %)
tf
IF = 0→5 mA , VCC = 5 V
―
30
Common Mode transient
Immunity at High Level Output
Common Mode transient
Immunity at Low Level Output
CMH
CML
VCM = 1000Vp-p, IF = 0 A,
-15
―
9
VCC = 20 V, Ta = 25 °C
VCM = 1000Vp-p, IF =5 mA, ₁₅
―
VCC = 20 V, Ta = 25 °C
*All typical values are at Ta = 25 °C
Note5. V_CC=4.5 to 20V at test circuit 7.
MAX
250
250
220
75
75
―
―
UNIT
ns
ns
ns
ns
ns
kV/μs
kV/μs
TEST CIRCUIT 1: VOL
I_{F 1}
→
↑
3
6
V_CC
5
0.1μF
GND ⁴
V_OL I_OL
V↑
V_CC
SHIELD
TEST CIRCUIT 2: VOH
1
6
V_CC
5
3
GND ⁴
SHIELD
V_O
V
↑ ^IOH
0.1μF
V_CC
*V_OH= V_CC-V_O
TEST CIRCUIT 3: ICCL
I_F
→
1
6
V_CC
I_CCL
A
↑
3
5
V_CC
GND ⁴
SHIELD
0.1μF
TEST CIRCUIT 4: ICCH
I_CCH
1
6
V_CC
A
5
V_CC
0.1μF
3
GND ⁴
SHIELD
TEST CIRCUIT 5: IOSL
TEST CIRCUIT 6: IOSH
I_{F 1}
→
↑
3
6
V_CC
5
GND ⁴
SHIELD
0.1μF
A
I_OSL
V_O
V_CC
1
6
V_CC
5
0.1μF
A
V_O
3
GND ⁴
I_OSH
V_CC
SHIELD
4
2009-09-10