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TLP3121 Datasheet, PDF (2/6 Pages) Toshiba Semiconductor – MEASUREMENT INSTRUMENTS LOGIC IC TESTERS / MEMORY TESTERS BOARD TESTERS / SCANNERS
TLP3121
MAXIMUM RATINGS (Ta = 25°C)
CHARACTERISTIC
SYMBOL
RATING
UNIT
Forward Current
Forward Current Derating (Ta >= 25°C)
Reverse Voltage
Junction Temperature
Off-State Output Terminal Voltage
On-State Current
On-State Current Derating (Ta >= 25°C)
Junction Temperature
Storage Temperature Range
Operating Temperature Range
Lead Soldering Temperature (10 s)
Isolation Voltage (AC, 1 minute, R.H. =< 60%) (NOTE1)
IF
∆IF/°C
VR
Tj
VOFF
ION
∆ION/°C
Tj
Tstg
Topr
Tsol
BVS
50
−0.5
5
125
80
350
−3.5
125
−40~125
−20~85
260
1500
mA
mA/°C
V
°C
V
mA
mA/°C
°C
°C
°C
°C
Vrms
(NOTE1) : Device considered a two-terminal device : Pins 1 and, 2 shorted together, and
pins 3 and 4 shorted together.
RECOMMENDED OPERATING CONDITIONS
CHARACTERISTIC
Supply Voltage
Forward Current
On-State Current
Operating Temperature
SYMBOL
VDD
IF
ION
Topr
MIN. TYP. MAX. UNIT


64
V
5

30 mA


350 mA
25

60
°C
INDIVIDUAL ELECTRICAL CHARACTERISTICS (Ta = 25°C)
CHARACTERISTIC
Forward Voltage
Reverse Current
Capacitance
Off-State Current
SYMBOL
TEST CONDITION
VF
IF = 10 mA
IR
VR = 5 V
CT
V = 0, f = 1 MHz
IOFF
VOFF = 30 V, Ta = 50°C
MIN.
1.0



TYP.
1.15

15
200
MAX.
1.3
10

UNIT
V
µA
pF
1000 pA
Capacitance
COFF
V = 0, f = 100 MHz

30
40
pF
2
2004-2-26